Patent Assignment Details
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| Reel/Frame: | 021757/0901 | |
| Pages: | 4 |
| | Recorded: | 10/29/2008 | | |
| Attorney Dkt #: | H-5696 |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE OF THE THIRD INVENTOR PREVIOUSLY RECORDED ON REEL 018965 FRAME 0807. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT TO HITACHI HIGH-TECHNOLOGIES CORPORATION. |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/27/2011
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Application #:
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11700838
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Filing Dt:
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02/01/2007
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Publication #:
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Pub Dt:
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08/09/2007
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Title:
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CHARGED PARTICLE APPARATUS, SCANNING ELECTRON MICROSCOPE, AND SAMPLE INSPECTION METHOD
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Assignee
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| 24-14, NISHISHINBASHI 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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JOHN R. MATTINGLY
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1800 DIAGONAL ROAD, SUITE 370
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ALEXANDRIA, VA 22314
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