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Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:022380/0773   Pages: 4
Recorded: 03/12/2009
Attorney Dkt #:509982800000
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 28
1
Patent #:
7427521
Issue Dt:
09/23/2008
Application #:
10274252
Filing Dt:
10/17/2002
Publication #:
US20040078173
Pub Dt:
04/22/2004
Title:
GENERATING SIMULATED DIFFRACTION SIGNALS FOR TWO-DIMENSIONAL STRUCTURES
2
Patent #:
7072049
Issue Dt:
07/04/2006
Application #:
10357705
Filing Dt:
02/03/2003
Publication #:
US20040150838
Pub Dt:
08/05/2004
Title:
MODEL OPTIMIZATION FOR STRUCTURES WITH ADDITIONAL MATERIALS
3
Patent #:
6791679
Issue Dt:
09/14/2004
Application #:
10358782
Filing Dt:
02/04/2003
Publication #:
US20040152221
Pub Dt:
08/05/2004
Title:
ADAPTIVE CORRELATION OF PATTERN RESIST STRUCTURES USING OPTICAL METROLOGY
4
Patent #:
7064829
Issue Dt:
06/20/2006
Application #:
10394327
Filing Dt:
03/20/2003
Publication #:
US20040184035
Pub Dt:
09/23/2004
Title:
GENERIC INTERFACE FOR AN OPTICAL METROLOGY SYSTEM
5
Patent #:
7046375
Issue Dt:
05/16/2006
Application #:
10428186
Filing Dt:
05/02/2003
Publication #:
US20040218192
Pub Dt:
11/04/2004
Title:
EDGE ROUGHNESS MEASUREMENT IN OPTICAL METROLOGY
6
Patent #:
7274472
Issue Dt:
09/25/2007
Application #:
10447609
Filing Dt:
05/28/2003
Publication #:
US20040239954
Pub Dt:
12/02/2004
Title:
RESOLUTION ENHANCED OPTICAL METROLOGY
7
Patent #:
7394554
Issue Dt:
07/01/2008
Application #:
10663300
Filing Dt:
09/15/2003
Publication #:
US20050057748
Pub Dt:
03/17/2005
Title:
SELECTING A HYPOTHETICAL PROFILE TO USE IN OPTICAL METROLOGY
8
Patent #:
7224471
Issue Dt:
05/29/2007
Application #:
10696246
Filing Dt:
10/28/2003
Publication #:
US20050088665
Pub Dt:
04/28/2005
Title:
AZIMUTHAL SCANNING OF A STRUCTURE FORMED ON A SEMICONDUCTOR WAFER
9
Patent #:
7126700
Issue Dt:
10/24/2006
Application #:
10735212
Filing Dt:
12/12/2003
Publication #:
US20050128489
Pub Dt:
06/16/2005
Title:
PARAMETRIC OPTIMIZATION OF OPTICAL METROLOGY MODEL
10
Patent #:
7065423
Issue Dt:
06/20/2006
Application #:
10888726
Filing Dt:
07/08/2004
Publication #:
US20060009872
Pub Dt:
01/12/2006
Title:
OPTICAL METROLOGY MODEL OPTIMIZATION FOR PROCESS CONTROL
11
Patent #:
7440881
Issue Dt:
10/21/2008
Application #:
10910018
Filing Dt:
08/02/2004
Publication #:
US20050007577
Pub Dt:
01/13/2005
Title:
ADAPTIVE CORRELATION OF PATTERN RESIST STRUCTURES USING OPTICAL METROLOGY
12
Patent #:
7171284
Issue Dt:
01/30/2007
Application #:
10946729
Filing Dt:
09/21/2004
Publication #:
US20060064280
Pub Dt:
03/23/2006
Title:
OPTICAL METROLOGY MODEL OPTIMIZATION BASED ON GOALS
13
Patent #:
7280229
Issue Dt:
10/09/2007
Application #:
11003961
Filing Dt:
12/03/2004
Publication #:
US20060119863
Pub Dt:
06/08/2006
Title:
EXAMINING A STRUCTURE FORMED ON A SEMICONDUCTOR WAFER USING MACHINE LEARNING SYSTEMS
14
Patent #:
7388677
Issue Dt:
06/17/2008
Application #:
11061303
Filing Dt:
02/18/2005
Publication #:
US20050209816
Pub Dt:
09/22/2005
Title:
OPTICAL METROLOGY OPTIMIZATION FOR REPETITIVE STRUCTURES
15
Patent #:
7274465
Issue Dt:
09/25/2007
Application #:
11061330
Filing Dt:
02/17/2005
Publication #:
US20060181713
Pub Dt:
08/17/2006
Title:
OPTICAL METROLOGY OF A STRUCTURE FORMED ON A SEMICONDUCTOR WAFER USING OPTICAL PULSES
16
Patent #:
7421414
Issue Dt:
09/02/2008
Application #:
11096782
Filing Dt:
03/31/2005
Publication #:
US20060224528
Pub Dt:
10/05/2006
Title:
SPLIT MACHINE LEARNING SYSTEMS
17
Patent #:
7355728
Issue Dt:
04/08/2008
Application #:
11155406
Filing Dt:
06/16/2005
Publication #:
US20060290947
Pub Dt:
12/28/2006
Title:
OPTICAL METROLOGY MODEL OPTIMIZATION FOR REPETITIVE STRUCTURES
18
Patent #:
7467064
Issue Dt:
12/16/2008
Application #:
11349773
Filing Dt:
02/07/2006
Publication #:
US20070185684
Pub Dt:
08/09/2007
Title:
TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM USING MULTIVARIATE ANALYSIS
19
Patent #:
7428060
Issue Dt:
09/23/2008
Application #:
11388265
Filing Dt:
03/24/2006
Publication #:
US20070223011
Pub Dt:
09/27/2007
Title:
OPTIMIZATION OF DIFFRACTION ORDER SELECTION FOR TWO-DIMENSIONAL STRUCTURES
20
Patent #:
7302367
Issue Dt:
11/27/2007
Application #:
11390798
Filing Dt:
03/27/2006
Publication #:
US20070225940
Pub Dt:
09/27/2007
Title:
LIBRARY ACCURACY ENHANCEMENT AND EVALUATION
21
Patent #:
7474420
Issue Dt:
01/06/2009
Application #:
11396164
Filing Dt:
03/30/2006
Publication #:
US20070229855
Pub Dt:
10/04/2007
Title:
IN-DIE OPTICAL METROLOGY
22
Patent #:
7444196
Issue Dt:
10/28/2008
Application #:
11408744
Filing Dt:
04/21/2006
Publication #:
US20070250200
Pub Dt:
10/25/2007
Title:
OPTIMIZED CHARACTERIZATION OF WAFERS STRUCTURES FOR OPTICAL METROLOGY
23
Patent #:
7271902
Issue Dt:
09/18/2007
Application #:
11471892
Filing Dt:
06/20/2006
Publication #:
US20060244966
Pub Dt:
11/02/2006
Title:
GENERIC INTERFACE FOR AN OPTICAL METROLOGY SYSTEM
24
Patent #:
7221989
Issue Dt:
05/22/2007
Application #:
11472133
Filing Dt:
06/20/2006
Publication #:
US20060247816
Pub Dt:
11/02/2006
Title:
OPTICAL METROLOGY MODEL OPTIMIZATION FOR PROCESS CONTROL
25
Patent #:
7395132
Issue Dt:
07/01/2008
Application #:
11804998
Filing Dt:
05/21/2007
Publication #:
US20070225851
Pub Dt:
09/27/2007
Title:
OPTICAL METROLOGY MODEL OPTIMIZATION FOR PROCESS CONTROL
26
Patent #:
7414733
Issue Dt:
08/19/2008
Application #:
11805932
Filing Dt:
05/25/2007
Publication #:
US20070236705
Pub Dt:
10/11/2007
Title:
AZIMUTHAL SCANNING OF A STRUCTURE FORMED ON A SEMICONDUCTOR WAFER
27
Patent #:
7450232
Issue Dt:
11/11/2008
Application #:
11856651
Filing Dt:
09/17/2007
Publication #:
US20080037017
Pub Dt:
02/14/2008
Title:
GENERIC INTERFACE FOR AN OPTICAL METROLOGY SYSTEM
28
Patent #:
7453584
Issue Dt:
11/18/2008
Application #:
11869591
Filing Dt:
10/09/2007
Publication #:
US20080033683
Pub Dt:
02/07/2008
Title:
EXAMINING A STRUCTURE FORMED ON A SEMICONDUCTOR WAFER USING MACHINE LEARNING SYSTEMS
Assignor
1
TIMBRE TECHNOLOGIES, INC.
Exec Dt:
03/12/2009
Assignee
1
TOKYO ELECTRON LIMITED
AKASAKA BIZ TOWER
3-1 AKASAKA 5-CHOME
MINATO-KU, TOKYO, JAPAN 107-6325
Correspondence name and address
PETER YIM
MORRISON & FOERSTER LLP
425 MARKET STREET
SAN FRANCISCO, CA 94105

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