Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 031872/0513 | |
| Pages: | 4 |
| | Recorded: | 01/06/2014 | | |
| Attorney Dkt #: | 048013 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
10
|
|
|
|
Patent #:
|
|
Issue Dt:
|
03/28/2006
|
Application #:
|
09802687
|
Filing Dt:
|
03/08/2001
|
|
Publication #:
|
|
Pub Dt:
|
12/20/2001
| | | | |
|
Title:
|
IMAGE ALIGNMENT METHOD, COMPARATIVE INSPECTION METHOD, AND COMPARATIVE INSPECTION DEVICE FOR COMPARATIVE INSPECTIONS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/01/2005
|
Application #:
|
09906678
|
Filing Dt:
|
07/18/2001
|
|
Publication #:
|
|
Pub Dt:
|
03/07/2002
| | | | |
|
Title:
|
METHOD FOR INSPECTING DEFECTS AND AN APPARATUS FOR THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/04/2005
|
Application #:
|
09942213
|
Filing Dt:
|
08/30/2001
|
|
Publication #:
|
|
Pub Dt:
|
12/26/2002
| | | | |
|
Title:
|
METHOD AND APPARATUS FOR INSPECTING A SEMICONDUCTOR DEVICE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/02/2003
|
Application #:
|
09942862
|
Filing Dt:
|
08/31/2001
|
|
Publication #:
|
|
Pub Dt:
|
12/26/2002
| | | | |
|
Title:
|
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
09/28/2004
|
Application #:
|
10232871
|
Filing Dt:
|
08/30/2002
|
|
Publication #:
|
|
Pub Dt:
|
03/20/2003
| | | | |
|
Title:
|
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES AND METHOD AND ITS APPARATUS FOR PROCESSING DETECTED DEFECT DATA
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
01/11/2005
|
Application #:
|
10348747
|
Filing Dt:
|
01/21/2003
|
|
Publication #:
|
|
Pub Dt:
|
07/24/2003
| | | | |
|
Title:
|
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICES AND METHOD AND ITS APPARATUS FOR PROCESSING DETECTED DEFECT DATA
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/06/2007
|
Application #:
|
11042173
|
Filing Dt:
|
01/26/2005
|
|
Publication #:
|
|
Pub Dt:
|
06/16/2005
| | | | |
|
Title:
|
METHOD FOR INSPECTING DEFECTS AND AN APPARATUS OF THE SAME
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/24/2006
|
Application #:
|
11140350
|
Filing Dt:
|
05/27/2005
|
|
Publication #:
|
|
Pub Dt:
|
10/06/2005
| | | | |
|
Title:
|
IMAGE ALIGNMENT METHOD, COMPARATIVE INSPECTION METHOD, AND COMPARATIVE INSPECTION DEVICE FOR COMPARATIVE INSPECTIONS
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
10/03/2006
|
Application #:
|
11235136
|
Filing Dt:
|
09/27/2005
|
|
Publication #:
|
|
Pub Dt:
|
01/26/2006
| | | | |
|
Title:
|
METHOD AND APPARATUS FOR INSPECTING A SEMICONDUCTOR DEVICE
|
|
|
|
|
Patent #:
|
|
Issue Dt:
|
02/19/2008
|
Application #:
|
11586203
|
Filing Dt:
|
10/24/2006
|
|
Publication #:
|
|
Pub Dt:
|
02/15/2007
| | | | |
|
Title:
|
IMAGE ALIGNMENT METHOD, COMPARATIVE INSPECTION METHOD, AND COMPARATIVE INSPECTION DEVICE FOR COMPARATIVE INSPECTIONS
|
|
|
Assignee
|
|
|
|
|
| 24-14, NISHI-SHIMBASHI 1-CHOME |
| MINATO-KU |
| TOKYO, JAPAN |
|
|
Correspondence name and address
|
| |
SUGHRUE MION, PLLC
|
| |
2100 PENNSYLVANIA AVE. NW
|
| |
SUITE 800
|
| |
WASHINGTON, DC 20037-3213
|
Search Results as of:
05/14/2024 07:12 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
