Patent Assignment Details
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| Reel/Frame: | 041095/0579 | |
| Pages: | 4 |
| | Recorded: | 01/26/2017 | | |
| Attorney Dkt #: | 036777.00026 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/26/2017
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Application #:
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15416686
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Filing Dt:
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01/26/2017
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Publication #:
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Pub Dt:
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05/25/2017
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Title:
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Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus
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Assignee
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| 24-14, NISHI-SHIMBASHI 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-0003 |
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Correspondence name and address
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BANNER & WITCOFF, LTD.
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1100 13TH ST. NW
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STE 1200
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WASHINGTON, DC 20005
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