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Reel/Frame:043902/0816   Pages: 25
Recorded: 09/19/2017
Attorney Dkt #:067237-0010 (3)
Conveyance: MERGER (SEE DOCUMENT FOR DETAILS).
Total properties: 24
1
Patent #:
5905650
Issue Dt:
05/18/1999
Application #:
08931505
Filing Dt:
09/16/1997
Title:
FAILURE ANALYZER
2
Patent #:
6027962
Issue Dt:
02/22/2000
Application #:
08991004
Filing Dt:
12/15/1997
Title:
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING BIPOLAR TRANSISTOR FIELD-EFFECT TRANSISTOR
3
Patent #:
5963815
Issue Dt:
10/05/1999
Application #:
09009966
Filing Dt:
01/21/1998
Title:
METHOD FOR FORMING A SURFACE -ROUGHENED CONDUCTIVE FILM ON A SEMICONDUCTOR WAFER
4
Patent #:
6016278
Issue Dt:
01/18/2000
Application #:
09055905
Filing Dt:
04/07/1998
Title:
FAILURE ANALYSIS METHOD AND DEVICE
5
Patent #:
6110834
Issue Dt:
08/29/2000
Application #:
09070914
Filing Dt:
05/04/1998
Title:
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF FOR REMOVING REACTION PRODUCTS OF DRY ETCHING
6
Patent #:
6281060
Issue Dt:
08/28/2001
Application #:
09257507
Filing Dt:
02/25/1999
Title:
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE CONTAINING A BiCMOS CIRCUIT
7
Patent #:
6194907
Issue Dt:
02/27/2001
Application #:
09326604
Filing Dt:
06/07/1999
Title:
PROBER AND ELECTRIC EVALUATION METHOD OF SEMICONDUCTOR DEVICE
8
Patent #:
6587975
Issue Dt:
07/01/2003
Application #:
09346268
Filing Dt:
07/01/1999
Publication #:
US20030070121
Pub Dt:
04/10/2003
Title:
SEMICONDUCTOR TEST APPARATUS AND METHOD
9
Patent #:
6215187
Issue Dt:
04/10/2001
Application #:
09400857
Filing Dt:
09/21/1999
Title:
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
10
Patent #:
6340543
Issue Dt:
01/22/2002
Application #:
09557326
Filing Dt:
04/25/2000
Title:
Photomask, manufacturing method thereof, and semiconductor device
11
Patent #:
6708302
Issue Dt:
03/16/2004
Application #:
09570461
Filing Dt:
05/12/2000
Title:
SEMICONDUCTOR MODULE
12
Patent #:
6990614
Issue Dt:
01/24/2006
Application #:
09641352
Filing Dt:
08/18/2000
Title:
DATA STORAGE APPARATUS AND DATA MEASURING APPARATUS
13
Patent #:
6788990
Issue Dt:
09/07/2004
Application #:
09656839
Filing Dt:
09/07/2000
Title:
PROCESS CONTROL DEVICE AND PROCESS CONTROL METHOD
14
Patent #:
6634004
Issue Dt:
10/14/2003
Application #:
09706696
Filing Dt:
11/07/2000
Title:
THRESHOLD ANALYSIS SYSTEM CAPABLE OF DECIDING ALL THRESHOLD VOLTAGES INCLUDED IN MEMORY DEVICE THROUGH SINGLE PROCESSING
15
Patent #:
6993696
Issue Dt:
01/31/2006
Application #:
09712246
Filing Dt:
11/15/2000
Title:
SEMICONDUCTOR MEMORY DEVICE WITH BUILT-IN SELF TEST CIRCUIT OPERATING AT HIGH RATE
16
Patent #:
6345004
Issue Dt:
02/05/2002
Application #:
09745421
Filing Dt:
12/26/2000
Publication #:
US20020008998
Pub Dt:
01/24/2002
Title:
Repair analysis circuit for redundancy, redundant repairing method, and semiconductor device
17
Patent #:
6642736
Issue Dt:
11/04/2003
Application #:
09904625
Filing Dt:
07/16/2001
Publication #:
US20020062200
Pub Dt:
05/23/2002
Title:
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS
18
Patent #:
6651023
Issue Dt:
11/18/2003
Application #:
09927367
Filing Dt:
08/13/2001
Publication #:
US20020106817
Pub Dt:
08/08/2002
Title:
SEMICONDUCTOR TEST APPARATUS, AND METHOD OF TESTING SEMICONDUCTOR DEVICE
19
Patent #:
6900627
Issue Dt:
05/31/2005
Application #:
09927368
Filing Dt:
08/13/2001
Publication #:
US20020105352
Pub Dt:
08/08/2002
Title:
APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
20
Patent #:
6690189
Issue Dt:
02/10/2004
Application #:
09927404
Filing Dt:
08/13/2001
Publication #:
US20020108080
Pub Dt:
08/08/2002
Title:
APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
21
Patent #:
6714888
Issue Dt:
03/30/2004
Application #:
09927470
Filing Dt:
08/13/2001
Publication #:
US20020107654
Pub Dt:
08/08/2002
Title:
APPARATUS FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT
22
Patent #:
6586823
Issue Dt:
07/01/2003
Application #:
10127759
Filing Dt:
04/23/2002
Publication #:
US20030030135
Pub Dt:
02/13/2003
Title:
SEMICONDUCTOR DEVICE THAT CAN HAVE A DEFECTIVE BIT FOUND DURING OR AFTER PACKAGING PROCESS REPAIRED
23
Patent #:
6724668
Issue Dt:
04/20/2004
Application #:
10140104
Filing Dt:
05/08/2002
Publication #:
US20030107926
Pub Dt:
06/12/2003
Title:
SEMICONDUCTOR DEVICE PROVIDED WITH MEMORY CHIPS
24
Patent #:
6661248
Issue Dt:
12/09/2003
Application #:
10145192
Filing Dt:
05/15/2002
Publication #:
US20030048112
Pub Dt:
03/13/2003
Title:
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS
Assignor
1
RENESAS NAKA SEMICONDUCTOR CORPORATION
Exec Dt:
04/01/2014
Assignee
1
RENESAS SEMICONDUCTOR MANUFACTURING CO., LTD.
751, HORIGUCHI, HITACHINAKA-SHI
IBARAKI, JAPAN
Correspondence name and address
MCDERMOTT WILL & EMERY LLP
THE MCDERMOTT BUILDING
500 NORTH CAPITOL STREET, N.W.
WASHINGTON, DC 20001

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