Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 051947/0292 | |
| Pages: | 4 |
| | Recorded: | 02/27/2020 | | |
| Attorney Dkt #: | 12389.0079 ET AL. |
| Conveyance: | MERGER AND CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
2
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Patent #:
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Issue Dt:
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03/24/2015
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Application #:
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13840489
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Filing Dt:
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03/15/2013
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Publication #:
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Pub Dt:
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09/19/2013
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Title:
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Method and Apparatus for Inspecting a Mask Substrate for Defects, Method of Manufacturing a Photomask, and Method of Manufacturing a Semiconductor Device
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Patent #:
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Issue Dt:
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12/16/2014
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Application #:
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13841049
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Filing Dt:
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03/15/2013
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Publication #:
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Pub Dt:
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09/19/2013
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Title:
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Optimum Imaging Position Detecting Method, Optimum Imaging Position Detecting Device, Photomask Manufacturing Method, and Semiconductor Device Manufacturing Method
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Assignor
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Newly Merged Entity Data
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Newly Merged Entity's New Name
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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Correspondence name and address
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JOHN M MULCAHY
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901 NEW YORK AVENUE, NW
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WASHINGTON, DC 20001
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05/08/2024 01:01 PM
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