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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 11 of 23
Pages: 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23

Patent #:	8885950	Issue Dt:	11/11/2014	Application #:	13502823	Filing Dt:	04/19/2012
Publication #:	US20120207397	Pub Dt:	08/16/2012
Title:	Pattern Matching Method and Pattern Matching Apparatus

Patent #:	8912487	Issue Dt:	12/16/2014	Application #:	13503074	Filing Dt:	04/20/2012
Publication #:	US20120211652	Pub Dt:	08/23/2012
Title:	Charged Particle Beam Device, Position Specification Method Used for Charged Particle Beam Device, and Program

Patent #:	9108832	Issue Dt:	08/18/2015	Application #:	13503952	Filing Dt:	04/25/2012
Publication #:	US20120213668	Pub Dt:	08/23/2012
Title:	COVER OPENER AND AUTOMATIC ANALYZING DEVICE USING SAME

Patent #:	9099281	Issue Dt:	08/04/2015	Application #:	13503976	Filing Dt:	04/25/2012
Publication #:	US20120212583	Pub Dt:	08/23/2012
Title:	Charged Particle Radiation Apparatus, and Method for Displaying Three-Dimensional Information in Charged Particle Radiation Apparatus

Patent #:	9200896	Issue Dt:	12/01/2015	Application #:	13504129	Filing Dt:	04/25/2012
Publication #:	US20120212602	Pub Dt:	08/23/2012
Title:	PATTERN DIMENSION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM MICROSCOPE USED IN SAME

Patent #:	8921784	Issue Dt:	12/30/2014	Application #:	13505517	Filing Dt:	05/02/2012
Publication #:	US20120211654	Pub Dt:	08/23/2012
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9109194	Issue Dt:	08/18/2015	Application #:	13505803	Filing Dt:	07/13/2012
Publication #:	US20120275681	Pub Dt:	11/01/2012
Title:	DEVICE FOR HARVESTING BACTERIAL COLONY AND METHOD THEREFOR

Patent #:	8742342	Issue Dt:	06/03/2014	Application #:	13505951	Filing Dt:	05/03/2012
Publication #:	US20120217393	Pub Dt:	08/30/2012
Title:	Electron Microscope

Patent #:	9395298	Issue Dt:	07/19/2016	Application #:	13509661	Filing Dt:	07/06/2012
Publication #:	US20120282139	Pub Dt:	11/08/2012
Title:	BLOOD COAGULATION ANALYZER

Patent #:	9390941	Issue Dt:	07/12/2016	Application #:	13510296	Filing Dt:	05/17/2012
Publication #:	US20120228261	Pub Dt:	09/13/2012
Title:	SAMPLE PROCESSING APPARATUS, SAMPLE PROCESSING SYSTEM, AND METHOD FOR PROCESSING SAMPLE

Patent #:	8953156	Issue Dt:	02/10/2015	Application #:	13510300	Filing Dt:	07/06/2012
Publication #:	US20120274931	Pub Dt:	11/01/2012
Title:	DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE PROVIDED WITH SAME

Patent #:	8934006	Issue Dt:	01/13/2015	Application #:	13511810	Filing Dt:	05/24/2012
Publication #:	US20120287257	Pub Dt:	11/15/2012
Title:	CHARGED-PARTICLE MICROSCOPE AND METHOD FOR CONTROLLING SAME

Patent #:	9019362	Issue Dt:	04/28/2015	Application #:	13513280	Filing Dt:	07/16/2012
Publication #:	US20120274757	Pub Dt:	11/01/2012
Title:	CHARGED PARTICLE BEAM DEVICE AND A METHOD OF IMPROVING IMAGE QUALITY OF THE SAME

Patent #:	8871080	Issue Dt:	10/28/2014	Application #:	13514187	Filing Dt:	06/26/2012
Publication #:	US20120261260	Pub Dt:	10/18/2012
Title:	MANAGEMENT SYSTEM FOR AN ELECTROLYTE ANALYZER

Patent #:	8901493	Issue Dt:	12/02/2014	Application #:	13514306	Filing Dt:	06/07/2012
Publication #:	US20120241611	Pub Dt:	09/27/2012
Title:	ELECTRON MICROSCOPE

Patent #:	8924001	Issue Dt:	12/30/2014	Application #:	13514708	Filing Dt:	06/28/2012
Publication #:	US20120310403	Pub Dt:	12/06/2012
Title:	ETCHING APPARATUS, CONTROL SIMULATOR,AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

Patent #:	8802008	Issue Dt:	08/12/2014	Application #:	13515017	Filing Dt:	06/11/2012
Publication #:	US20120251393	Pub Dt:	10/04/2012
Title:	DISPENSING NOZZLE FOR AUTOMATIC ANALYZER, AND AUTOMATIC ANALYZER INCLUDING SAME

Patent #:	8747743	Issue Dt:	06/10/2014	Application #:	13515344	Filing Dt:	06/27/2012
Publication #:	US20120269682	Pub Dt:	10/25/2012
Title:	AUTOMATIC ANALYZER

Patent #:	9201085	Issue Dt:	12/01/2015	Application #:	13515356	Filing Dt:	06/12/2012
Publication #:	US20120251389	Pub Dt:	10/04/2012
Title:	AUTOMATIC ANALYZING DEVICE

Patent #:	8703056	Issue Dt:	04/22/2014	Application #:	13515580	Filing Dt:	08/20/2012
Publication #:	US20120328475	Pub Dt:	12/27/2012
Title:	AUTOMATED ANALYZER AND DEVICE FOR OPENING/CLOSING THE LIDS OF REAGENT VESSELS

Patent #:	8824773	Issue Dt:	09/02/2014	Application #:	13515643	Filing Dt:	08/06/2012
Publication #:	US20130140457	Pub Dt:	06/06/2013
Title:	DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE

Patent #:	8546770	Issue Dt:	10/01/2013	Application #:	13515717	Filing Dt:	08/07/2012
Publication #:	US20120292507	Pub Dt:	11/22/2012
Title:	CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

Patent #:	NONE	Issue Dt:		Application #:	13516006	Filing Dt:	07/27/2012
Publication #:	US20120282137	Pub Dt:	11/08/2012
Title:	AUTOMATIC ANALYZER

Patent #:	9442127	Issue Dt:	09/13/2016	Application #:	13516157	Filing Dt:	06/14/2012
Publication #:	US20120309104	Pub Dt:	12/06/2012
Title:	Sample Processing Device, Sample Processing Method, and Reaction Container Used in These Device and Method

Patent #:	9013571	Issue Dt:	04/21/2015	Application #:	13516565	Filing Dt:	06/15/2012
Publication #:	US20120257039	Pub Dt:	10/11/2012
Title:	IMAGE PROCESSING DEVICE, MEASURING/TESTING SYSTEM, AND PROGRAM

Patent #:	9024272	Issue Dt:	05/05/2015	Application #:	13518706	Filing Dt:	06/22/2012
Publication #:	US20120267528	Pub Dt:	10/25/2012
Title:	PATTERN MEASURING APPARATUS

Patent #:	9041921	Issue Dt:	05/26/2015	Application #:	13519138	Filing Dt:	08/28/2012
Publication #:	US20130003052	Pub Dt:	01/03/2013
Title:	DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Patent #:	8842280	Issue Dt:	09/23/2014	Application #:	13519228	Filing Dt:	09/13/2012
Publication #:	US20130017595	Pub Dt:	01/17/2013
Title:	ANALYTICAL APPARATUS AND DETECTION METHOD EMPLOYED IN ANALYTICAL APPARATUS

Patent #:	8835841	Issue Dt:	09/16/2014	Application #:	13519587	Filing Dt:	06/28/2012
Publication #:	US20120292495	Pub Dt:	11/22/2012
Title:	MASS SPECTROMETER AND MASS SPECTROMETRY

Patent #:	9390490	Issue Dt:	07/12/2016	Application #:	13520210	Filing Dt:	11/27/2012
Publication #:	US20130070078	Pub Dt:	03/21/2013
Title:	METHOD AND DEVICE FOR TESTING DEFECT USING SEM

Patent #:	8937714	Issue Dt:	01/20/2015	Application #:	13520460	Filing Dt:	07/03/2012
Publication #:	US20120314211	Pub Dt:	12/13/2012
Title:	INSPECTING APPARATUS AND INSPECTING METHOD

Patent #:	8879821	Issue Dt:	11/04/2014	Application #:	13520479	Filing Dt:	07/03/2012
Publication #:	US20130011043	Pub Dt:	01/10/2013
Title:	DEFECT INSPECTING DEVICE AND DEFECT INSPECTING METHOD

Patent #:	9255793	Issue Dt:	02/09/2016	Application #:	13521086	Filing Dt:	07/30/2012
Publication #:	US20120296576	Pub Dt:	11/22/2012
Title:	DEFECT INSPECTION METHOD AND DEVICE THEREOF

Patent #:	9202667	Issue Dt:	12/01/2015	Application #:	13521092	Filing Dt:	08/21/2012
Publication #:	US20130043388	Pub Dt:	02/21/2013
Title:	CHARGED PARTICLE RADIATION DEVICE WITH BANDPASS DETECTION

Patent #:	8993961	Issue Dt:	03/31/2015	Application #:	13522132	Filing Dt:	07/13/2012
Publication #:	US20120287258	Pub Dt:	11/15/2012
Title:	ELECTRIC CHARGED PARTICLE BEAM MICROSCOPE AND ELECTRIC CHARGED PARTICLE BEAM MICROSCOPY

Patent #:	8710434	Issue Dt:	04/29/2014	Application #:	13522351	Filing Dt:	07/16/2012
Publication #:	US20120326021	Pub Dt:	12/27/2012
Title:	MASS SPECTROMETRY DEVICE AND METHOD USING ION-MOLECULE REACTION IONIZATION

Patent #:	9110384	Issue Dt:	08/18/2015	Application #:	13522984	Filing Dt:	07/19/2012
Publication #:	US20120298865	Pub Dt:	11/29/2012
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	8994815	Issue Dt:	03/31/2015	Application #:	13523000	Filing Dt:	07/19/2012
Publication #:	US20120300054	Pub Dt:	11/29/2012
Title:	Method of Extracting Contour Lines of Image Data Obtained By Means of Charged Particle Beam Device, and Contour Line Extraction Device

Patent #:	9036141	Issue Dt:	05/19/2015	Application #:	13526989	Filing Dt:	06/19/2012
Publication #:	US20120327403	Pub Dt:	12/27/2012
Title:	SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD

Patent #:	8710430	Issue Dt:	04/29/2014	Application #:	13527619	Filing Dt:	06/20/2012
Publication #:	US20120326027	Pub Dt:	12/27/2012
Title:	MASS SPECTROMETRY METHOD

Patent #:	9184037	Issue Dt:	11/10/2015	Application #:	13527627	Filing Dt:	06/20/2012
Publication #:	US20120326022	Pub Dt:	12/27/2012
Title:	MASS SPECTROMETER AND MASS ANALYZING METHOD

Patent #:	8508727	Issue Dt:	08/13/2013	Application #:	13529363	Filing Dt:	06/21/2012
Publication #:	US20120262709	Pub Dt:	10/18/2012
Title:	DEFECTS INSPECTING APPARATUS AND DEFECTS INSPECTING METHOD

Patent #:	8496877	Issue Dt:	07/30/2013	Application #:	13529395	Filing Dt:	06/21/2012
Publication #:	US20120258012	Pub Dt:	10/11/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8431893	Issue Dt:	04/30/2013	Application #:	13530797	Filing Dt:	06/22/2012
Publication #:	US20120261574	Pub Dt:	10/18/2012
Title:	ELECTRON BEAM APPARATUS AND ELECTRON BEAM INSPECTION METHOD

Patent #:	8906671	Issue Dt:	12/09/2014	Application #:	13532308	Filing Dt:	06/25/2012
Publication #:	US20120329143	Pub Dt:	12/27/2012
Title:	Chilled Reagent Container and Nucleic Acid Analyzer

Patent #:	8467048	Issue Dt:	06/18/2013	Application #:	13535955	Filing Dt:	06/28/2012
Publication #:	US20120268734	Pub Dt:	10/25/2012
Title:	PATTERN DEFECT INSPECTION APPARATUS AND METHOD

Patent #:	8519332	Issue Dt:	08/27/2013	Application #:	13537463	Filing Dt:	06/29/2012
Publication #:	US20120261589	Pub Dt:	10/18/2012
Title:	SEMICONDUCTOR INSPECTING APPARATUS

Patent #:	8502145	Issue Dt:	08/06/2013	Application #:	13541939	Filing Dt:	07/05/2012
Publication #:	US20120267529	Pub Dt:	10/25/2012
Title:	ELECTRON MICROSCOPE SYSTEM AND METHOD FOR EVALUATING FILM THICKNESS REDUCTION OF RESIST PATTERNS

Patent #:	9070724	Issue Dt:	06/30/2015	Application #:	13546071	Filing Dt:	07/11/2012
Publication #:	US20120273132	Pub Dt:	11/01/2012
Title:	Vacuum Processing Apparatus And Plasma Processing Apparatus With Temperature Control Function For Wafer Stage

Patent #:	8999240	Issue Dt:	04/07/2015	Application #:	13546628	Filing Dt:	07/11/2012
Publication #:	US20120282141	Pub Dt:	11/08/2012
Title:	AUTOMATIC ANALYZER

Patent #:	9490104	Issue Dt:	11/08/2016	Application #:	13550638	Filing Dt:	07/17/2012
Publication #:	US20130112670	Pub Dt:	05/09/2013
Title:	HEAT TREATMENT APPARATUS

Patent #:	8431915	Issue Dt:	04/30/2013	Application #:	13551452	Filing Dt:	07/17/2012
Publication #:	US20120280126	Pub Dt:	11/08/2012
Title:	CHARGED PARTICLE BEAM APPARATUS PERMITTING HIGH RESOLUTION AND HIGH-CONTRAST OBSERVATION

Patent #:	8685220	Issue Dt:	04/01/2014	Application #:	13559445	Filing Dt:	07/26/2012
Publication #:	US20120292189	Pub Dt:	11/22/2012
Title:	CAPILLARY ELECTROPHORESIS APPARATUS

Patent #:	9229019	Issue Dt:	01/05/2016	Application #:	13560114	Filing Dt:	07/27/2012
Publication #:	US20120294764	Pub Dt:	11/22/2012
Title:	AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM

Patent #:	9543135	Issue Dt:	01/10/2017	Application #:	13562435	Filing Dt:	07/31/2012
Publication #:	US20130048851	Pub Dt:	02/28/2013
Title:	MASS SPECTROMETER AND MASS ANALYZING METHOD FOR EFFICIENTLY IONIZING A SAMPLE WITH LESS CARRY-OVER

Patent #:	8487250	Issue Dt:	07/16/2013	Application #:	13568922	Filing Dt:	08/07/2012
Publication #:	US20120298863	Pub Dt:	11/29/2012
Title:	METHOD FOR DETECTING INFORMATION OF AN ELECTRONIC POTENTIAL ON A SAMPLE AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	8831892	Issue Dt:	09/09/2014	Application #:	13572442	Filing Dt:	08/10/2012
Publication #:	US20120310546	Pub Dt:	12/06/2012
Title:	CHROMATOGRAPH ANALYZING DEVICE

Patent #:	9390900	Issue Dt:	07/12/2016	Application #:	13574788	Filing Dt:	07/24/2012
Publication #:	US20120292501	Pub Dt:	11/22/2012
Title:	MASS SPECTROMETER

Patent #:	8908172	Issue Dt:	12/09/2014	Application #:	13575050	Filing Dt:	07/25/2012
Publication #:	US20120293795	Pub Dt:	11/22/2012
Title:	DEFECT INSPECTION DEVICE AND METHOD OF INSPECTING DEFECT

Patent #:	9031794	Issue Dt:	05/12/2015	Application #:	13575169	Filing Dt:	07/25/2012
Publication #:	US20120294765	Pub Dt:	11/22/2012
Title:	AUTOMATIC ANALYZING SYSTEM

Patent #:	8728395	Issue Dt:	05/20/2014	Application #:	13575503	Filing Dt:	08/27/2012
Publication #:	US20120328476	Pub Dt:	12/27/2012
Title:	AUTOMATIC ANALYZER

Patent #:	8774493	Issue Dt:	07/08/2014	Application #:	13575531	Filing Dt:	07/26/2012
Publication #:	US20120308152	Pub Dt:	12/06/2012
Title:	APPARATUS FOR FORMING IMAGE FOR PATTERN MATCHING

Patent #:	9207235	Issue Dt:	12/08/2015	Application #:	13575564	Filing Dt:	07/26/2012
Publication #:	US20120316087	Pub Dt:	12/13/2012
Title:	Nucleic Acid Analyzer, Reaction Device for Nucleic Acid Analysis and Substrate of Reaction Device for Nucleic Acid Analysis

Patent #:	8878925	Issue Dt:	11/04/2014	Application #:	13575822	Filing Dt:	07/27/2012
Publication #:	US20120300056	Pub Dt:	11/29/2012
Title:	OBSERVATION METHOD AND OBSERVATION DEVICE

Patent #:	8581219	Issue Dt:	11/12/2013	Application #:	13576072	Filing Dt:	07/30/2012
Publication #:	US20130001420	Pub Dt:	01/03/2013
Title:	COMPOSITE CHARGED-PARTICLE-BEAM APPARATUS

Patent #:	NONE	Issue Dt:		Application #:	13577348	Filing Dt:	08/06/2012
Publication #:	US20130010290	Pub Dt:	01/10/2013
Title:	SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD

Patent #:	8653456	Issue Dt:	02/18/2014	Application #:	13577568	Filing Dt:	08/07/2012
Publication #:	US20120305767	Pub Dt:	12/06/2012
Title:	Pattern Inspection Method, Pattern Inspection Program, and Electronic Device Inspection System

Patent #:	8658987	Issue Dt:	02/25/2014	Application #:	13577719	Filing Dt:	08/08/2012
Publication #:	US20120305768	Pub Dt:	12/06/2012
Title:	CIRCUIT-PATTERN INSPECTION DEVICE

Patent #:	8878144	Issue Dt:	11/04/2014	Application #:	13577751	Filing Dt:	08/08/2012
Publication #:	US20120305769	Pub Dt:	12/06/2012
Title:	ELECTRON MICROSCOPE AND SAMPLE HOLDER

Patent #:	9099283	Issue Dt:	08/04/2015	Application #:	13577833	Filing Dt:	08/08/2012
Publication #:	US20120307038	Pub Dt:	12/06/2012
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	8858882	Issue Dt:	10/14/2014	Application #:	13577963	Filing Dt:	08/09/2012
Publication #:	US20120315190	Pub Dt:	12/13/2012
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	8766542	Issue Dt:	07/01/2014	Application #:	13577998	Filing Dt:	09/26/2012
Publication #:	US20130200788	Pub Dt:	08/08/2013
Title:	FIELD-EMISSION ELECTRON GUN AND METHOD FOR CONTROLLING SAME

Patent #:	8692197	Issue Dt:	04/08/2014	Application #:	13578179	Filing Dt:	08/09/2012
Publication #:	US20120318977	Pub Dt:	12/20/2012
Title:	SCANNING ELECTRON MICROSCOPE OPTICAL CONDITION SETTING METHOD AND SCANNING ELECTRON MICROSCOPE

Patent #:	8717557	Issue Dt:	05/06/2014	Application #:	13578581	Filing Dt:	08/10/2012
Publication #:	US20120307240	Pub Dt:	12/06/2012
Title:	SPECTROPHOTOMETER AND METHOD FOR DETERMINING PERFORMANCE THEREOF

Patent #:	8687921	Issue Dt:	04/01/2014	Application #:	13578651	Filing Dt:	09/13/2012
Publication #:	US20130011080	Pub Dt:	01/10/2013
Title:	IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND IMAGE PROCESSING PROGRAM

Patent #:	NONE	Issue Dt:		Application #:	13579965	Filing Dt:	09/20/2012
Publication #:	US20130148113	Pub Dt:	06/13/2013
Title:	INSPECTION APPARATUS AND INSPECTION METHOD

Patent #:	9128070	Issue Dt:	09/08/2015	Application #:	13580249	Filing Dt:	08/21/2012
Publication #:	US20120322139	Pub Dt:	12/20/2012
Title:	ANALYSIS DEVICE

Patent #:	9640366	Issue Dt:	05/02/2017	Application #:	13580288	Filing Dt:	08/21/2012
Publication #:	US20130009057	Pub Dt:	01/10/2013
Title:	ELECTRON BEAM IRRADIATION METHOD AND SCANNING ELECTRON MICROSCOPE

Patent #:	8723536	Issue Dt:	05/13/2014	Application #:	13580473	Filing Dt:	09/20/2012
Publication #:	US20130154675	Pub Dt:	06/20/2013
Title:	INSPECTION APPARATUS, SUBSTRATE MOUNTING DEVICE AND INSPECTION METHOD

Patent #:	NONE	Issue Dt:		Application #:	13580576	Filing Dt:	08/22/2012
Publication #:	US20120326033	Pub Dt:	12/27/2012
Title:	METHOD FOR SUPERIMPOSING AND DISPLAYING ELECTRON MICROSCOPE IMAGE AND OPTICAL IMAGE

Patent #:	9261360	Issue Dt:	02/16/2016	Application #:	13580875	Filing Dt:	09/14/2012
Publication #:	US20120327213	Pub Dt:	12/27/2012
Title:	CHARGED PARTICLE BEAM MICROSCOPE

Patent #:	9245780	Issue Dt:	01/26/2016	Application #:	13592408	Filing Dt:	08/23/2012
Publication #:	US20130142595	Pub Dt:	06/06/2013
Title:	VACUUM PROCESSING APPARATUS AND OPERATING METHOD OF THE SAME

Patent #:	8660336	Issue Dt:	02/25/2014	Application #:	13593227	Filing Dt:	08/23/2012
Publication #:	US20130058558	Pub Dt:	03/07/2013
Title:	DEFECT INSPECTION SYSTEM

Patent #:	8563944	Issue Dt:	10/22/2013	Application #:	13595588	Filing Dt:	08/27/2012
Publication #:	US20120319003	Pub Dt:	12/20/2012
Title:	ION BEAM DEVICE

Patent #:	8705026	Issue Dt:	04/22/2014	Application #:	13597553	Filing Dt:	08/29/2012
Publication #:	US20120320373	Pub Dt:	12/20/2012
Title:	INSPECTION APPARATUS

Patent #:	8455824	Issue Dt:	06/04/2013	Application #:	13601893	Filing Dt:	08/31/2012
Publication #:	US20120326028	Pub Dt:	12/27/2012
Title:	CHARGED PARTICLE BEAM APPARATUS, AND SAMPLE PROCESSING AND OBSERVATION METHOD

Patent #:	8920665	Issue Dt:	12/30/2014	Application #:	13602421	Filing Dt:	09/04/2012
Publication #:	US20140001154	Pub Dt:	01/02/2014
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	8639019	Issue Dt:	01/28/2014	Application #:	13611664	Filing Dt:	09/12/2012
Publication #:	US20130004057	Pub Dt:	01/03/2013
Title:	METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS

Patent #:	9273394	Issue Dt:	03/01/2016	Application #:	13612919	Filing Dt:	09/13/2012
Publication #:	US20140041804	Pub Dt:	02/13/2014
Title:	PLASMA PROCESSING APPARATUS AND DIAGNOSIS METHOD THEREOF

Patent #:	9110461	Issue Dt:	08/18/2015	Application #:	13612937	Filing Dt:	09/13/2012
Publication #:	US20130173042	Pub Dt:	07/04/2013
Title:	SEMICONDUCTOR MANUFACTURING EQUIPMENT

Patent #:	8916096	Issue Dt:	12/23/2014	Application #:	13618248	Filing Dt:	09/14/2012
Publication #:	US20130089464	Pub Dt:	04/11/2013
Title:	AUTOMATIC ANALYZER

Patent #:	8588962	Issue Dt:	11/19/2013	Application #:	13633155	Filing Dt:	10/02/2012
Publication #:	US20130108400	Pub Dt:	05/02/2013
Title:	VACUUM PROCESSING DEVICE AND METHOD OF TRANSPORTING PROCESS SUBJECT MEMBER

Patent #:	8692195	Issue Dt:	04/08/2014	Application #:	13633476	Filing Dt:	10/02/2012
Publication #:	US20130026363	Pub Dt:	01/31/2013
Title:	CHARGED PARTICLE RADIATION DEVICE

Patent #:	9311697	Issue Dt:	04/12/2016	Application #:	13639103	Filing Dt:	12/06/2012
Publication #:	US20130108147	Pub Dt:	05/02/2013
Title:	INSPECTION METHOD AND DEVICE THEREFOR

Patent #:	8519334	Issue Dt:	08/27/2013	Application #:	13639999	Filing Dt:	10/08/2012
Publication #:	US20130037716	Pub Dt:	02/14/2013
Title:	SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

Patent #:	8969828	Issue Dt:	03/03/2015	Application #:	13640560	Filing Dt:	10/15/2012
Publication #:	US20130048854	Pub Dt:	02/28/2013
Title:	SCANNING ELECTRON MICROSCOPE WITH A TABLE BEING GUIDED BY ROLLING FRICTION ELEMENTS

Patent #:	9202672	Issue Dt:	12/01/2015	Application #:	13641211	Filing Dt:	10/15/2012
Publication #:	US20130032714	Pub Dt:	02/07/2013
Title:	APPARATUS AND METHOD FOR PROBE SHAPE PROCESSING BY ION BEAM

Patent #:	10203277	Issue Dt:	02/12/2019	Application #:	13641881	Filing Dt:	10/18/2012
Publication #:	US20130046480	Pub Dt:	02/21/2013
Title:	AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Patent #:	8804109	Issue Dt:	08/12/2014	Application #:	13656353	Filing Dt:	10/19/2012
Publication #:	US20130182100	Pub Dt:	07/18/2013
Title:	DEFECT INSPECTION SYSTEM

100

Patent #:	8741166	Issue Dt:	06/03/2014	Application #:	13664940	Filing Dt:	10/31/2012
Publication #:	US20130157470	Pub Dt:	06/20/2013
Title:	PLASMA ETCHING METHOD

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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