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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 15 of 23
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Patent #:	9058959	Issue Dt:	06/16/2015	Application #:	14363252	Filing Dt:	06/05/2014
Publication #:	US20150048247	Pub Dt:	02/19/2015
Title:	SCANNING ION MICROSCOPE AND SECONDARY PARTICLE CONTROL METHOD

Patent #:	9658153	Issue Dt:	05/23/2017	Application #:	14363366	Filing Dt:	06/06/2014
Publication #:	US20140332674	Pub Dt:	11/13/2014
Title:	FLOW CELL AND LIQUID ANALYZER

Patent #:	NONE	Issue Dt:		Application #:	14364227	Filing Dt:	06/10/2014
Publication #:	US20140377132	Pub Dt:	12/25/2014
Title:	AUTOMATIC ANALYZER

Patent #:	9632100	Issue Dt:	04/25/2017	Application #:	14364237	Filing Dt:	06/10/2014
Publication #:	US20140373642	Pub Dt:	12/25/2014
Title:	SAMPLE PRETREATMENT SYSTEM THAT SUPPORTS MULTISYSTEM CONFIGURATION

Patent #:	9489324	Issue Dt:	11/08/2016	Application #:	14364371	Filing Dt:	06/11/2014
Publication #:	US20140372656	Pub Dt:	12/18/2014
Title:	DATA PROCESSING DEVICE, SEMICONDUCTOR EXTERNAL VIEW INSPECTION DEVICE, AND DATA VOLUME INCREASE ALLEVIATION METHOD

Patent #:	9644955	Issue Dt:	05/09/2017	Application #:	14364392	Filing Dt:	06/11/2014
Publication #:	US20140339425	Pub Dt:	11/20/2014
Title:	SCANNING ELECTRON BEAM DEVICE WITH FOCUS ADJUSTMENT BASED ON ACCELERATION VOLTAGE AND DIMENSION MEASUREMENT METHOD USING SAME

Patent #:	9714449	Issue Dt:	07/25/2017	Application #:	14364940	Filing Dt:	06/12/2014
Publication #:	US20140342922	Pub Dt:	11/20/2014
Title:	NUCLEIC ACID AMPLIFICATION METHOD

Patent #:	9897519	Issue Dt:	02/20/2018	Application #:	14366079	Filing Dt:	06/17/2014
Publication #:	US20140363896	Pub Dt:	12/11/2014
Title:	AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE

Patent #:	9383375	Issue Dt:	07/05/2016	Application #:	14366095	Filing Dt:	06/17/2014
Publication #:	US20140322080	Pub Dt:	10/30/2014
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	9506942	Issue Dt:	11/29/2016	Application #:	14367066	Filing Dt:	06/19/2014
Publication #:	US20140356964	Pub Dt:	12/04/2014
Title:	AUTOMATIC ANALYZER AND METHOD FOR DETECTING MEASUREMENT VALUE ABNORMALITIES

Patent #:	9436990	Issue Dt:	09/06/2016	Application #:	14367186	Filing Dt:	06/19/2014
Publication #:	US20150003722	Pub Dt:	01/01/2015
Title:	DEFECT OBSERVATION METHOD AND DEVICE THEREFOR

Patent #:	9709587	Issue Dt:	07/18/2017	Application #:	14370076	Filing Dt:	07/01/2014
Publication #:	US20140356233	Pub Dt:	12/04/2014
Title:	AUTOMATIC ANALYZER AND REAGENT PROCESSING METHOD IN AUTOMATIC ANALYZER

Patent #:	9514528	Issue Dt:	12/06/2016	Application #:	14370360	Filing Dt:	07/02/2014
Publication #:	US20140341461	Pub Dt:	11/20/2014
Title:	IMAGE PROCESSING APPARATUS, DISTORTION-CORRECTED MAP CREATION APPARATUS, AND SEMICONDUCTOR MEASUREMENT APPARATUS

Patent #:	9799112	Issue Dt:	10/24/2017	Application #:	14370727	Filing Dt:	07/03/2014
Publication #:	US20140375793	Pub Dt:	12/25/2014
Title:	METHOD FOR MEASURING OVERLAY AND MEASURING APPARATUS, SCANNING ELECTRON MICROSCOPE, AND GUI

Patent #:	9012842	Issue Dt:	04/21/2015	Application #:	14370736	Filing Dt:	07/03/2014
Publication #:	US20150001393	Pub Dt:	01/01/2015
Title:	CHARGED PARTICLE BEAM DEVICE AND INCLINED OBSERVATION IMAGE DISPLAY METHOD

Patent #:	9343265	Issue Dt:	05/17/2016	Application #:	14370763	Filing Dt:	07/04/2014
Publication #:	US20140353151	Pub Dt:	12/04/2014
Title:	CHARGED PARTICLE BEAM IRRADIATION APPARATUS

Patent #:	9558910	Issue Dt:	01/31/2017	Application #:	14371032	Filing Dt:	07/08/2014
Publication #:	US20140353499	Pub Dt:	12/04/2014
Title:	SAMPLE HOLDER FOR ELECTRON MICROSCOPE

Patent #:	9177775	Issue Dt:	11/03/2015	Application #:	14371043	Filing Dt:	07/08/2014
Publication #:	US20150001392	Pub Dt:	01/01/2015
Title:	MASS SPECTROMETER

Patent #:	9530614	Issue Dt:	12/27/2016	Application #:	14373123	Filing Dt:	07/18/2014
Publication #:	US20150060654	Pub Dt:	03/05/2015
Title:	CHARGED PARTICLE BEAM DEVICE AND ARITHMETIC DEVICE

Patent #:	8963102	Issue Dt:	02/24/2015	Application #:	14373359	Filing Dt:	07/20/2014
Publication #:	US20140353500	Pub Dt:	12/04/2014
Title:	CHARGED PARTICLE BEAM MICROSCOPE, SAMPLE HOLDER FOR CHARGED PARTICLE BEAM MICROSCOPE, AND CHARGED PARTICLE BEAM MICROSCOPY

Patent #:	9846170	Issue Dt:	12/19/2017	Application #:	14373368	Filing Dt:	07/21/2014
Publication #:	US20150010436	Pub Dt:	01/08/2015
Title:	AUTOMATED ANALYZER

Patent #:	9086343	Issue Dt:	07/21/2015	Application #:	14376425	Filing Dt:	08/03/2014
Publication #:	US20140370540	Pub Dt:	12/18/2014
Title:	METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF

Patent #:	9366625	Issue Dt:	06/14/2016	Application #:	14376479	Filing Dt:	08/04/2014
Publication #:	US20140375988	Pub Dt:	12/25/2014
Title:	SURFACE MEASUREMENT DEVICE

Patent #:	9963776	Issue Dt:	05/08/2018	Application #:	14376860	Filing Dt:	08/06/2014
Publication #:	US20150299842	Pub Dt:	10/22/2015
Title:	CHARGED PARTICLE DEVICE AND WIRING METHOD

Patent #:	9105446	Issue Dt:	08/11/2015	Application #:	14376901	Filing Dt:	08/06/2014
Publication #:	US20150097123	Pub Dt:	04/09/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9978558	Issue Dt:	05/22/2018	Application #:	14377127	Filing Dt:	08/06/2014
Publication #:	US20150002651	Pub Dt:	01/01/2015
Title:	SCANNING-ELECTRON-MICROSCOPE IMAGE PROCESSING DEVICE AND SCANNING METHOD

Patent #:	10041963	Issue Dt:	08/07/2018	Application #:	14377304	Filing Dt:	08/07/2014
Publication #:	US20150029331	Pub Dt:	01/29/2015
Title:	SYSTEM FOR ADJUSTING AUTOMATIC ANALYSIS, METHOD FOR ADJUSTING AUTOMATIC ANALYSIS

Patent #:	10197783	Issue Dt:	02/05/2019	Application #:	14377382	Filing Dt:	08/07/2014
Publication #:	US20150002652	Pub Dt:	01/01/2015
Title:	Image-Forming Device, and Dimension Measurement Device

Patent #:	9830705	Issue Dt:	11/28/2017	Application #:	14377728	Filing Dt:	08/08/2014
Publication #:	US20150287201	Pub Dt:	10/08/2015
Title:	IMAGE EVALUATION APPARATUS AND PATTERN SHAPE EVALUATION APPARATUS

Patent #:	9513228	Issue Dt:	12/06/2016	Application #:	14377753	Filing Dt:	08/08/2014
Publication #:	US20150022806	Pub Dt:	01/22/2015
Title:	DEFECT INSPECTION METHOD AND ITS DEVICE

Patent #:	9208995	Issue Dt:	12/08/2015	Application #:	14379291	Filing Dt:	08/16/2014
Publication #:	US20150014530	Pub Dt:	01/15/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9791465	Issue Dt:	10/17/2017	Application #:	14379350	Filing Dt:	08/18/2014
Publication #:	US20150037214	Pub Dt:	02/05/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9400247	Issue Dt:	07/26/2016	Application #:	14379356	Filing Dt:	08/18/2014
Publication #:	US20150033831	Pub Dt:	02/05/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9846931	Issue Dt:	12/19/2017	Application #:	14379425	Filing Dt:	08/18/2014
Publication #:	US20150016709	Pub Dt:	01/15/2015
Title:	Pattern Sensing Device and Semiconductor Sensing System

Patent #:	9136089	Issue Dt:	09/15/2015	Application #:	14379659	Filing Dt:	08/19/2014
Publication #:	US20150041649	Pub Dt:	02/12/2015
Title:	Pattern Dimension Measuring Device, Charged Particle Beam Apparatus, and Computer Program

Patent #:	9245710	Issue Dt:	01/26/2016	Application #:	14379694	Filing Dt:	08/19/2014
Publication #:	US20150060694	Pub Dt:	03/05/2015
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	9159529	Issue Dt:	10/13/2015	Application #:	14379704	Filing Dt:	08/19/2014
Publication #:	US20150014531	Pub Dt:	01/15/2015
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9472376	Issue Dt:	10/18/2016	Application #:	14379715	Filing Dt:	08/19/2014
Publication #:	US20150008322	Pub Dt:	01/08/2015
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9305745	Issue Dt:	04/05/2016	Application #:	14379733	Filing Dt:	08/19/2014
Publication #:	US20150034824	Pub Dt:	02/05/2015
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9804065	Issue Dt:	10/31/2017	Application #:	14379787	Filing Dt:	08/20/2014
Publication #:	US20150031143	Pub Dt:	01/29/2015
Title:	SYSTEM FOR PRETREATING SAMPLE

Patent #:	9499900	Issue Dt:	11/22/2016	Application #:	14379805	Filing Dt:	08/20/2014
Publication #:	US20150008121	Pub Dt:	01/08/2015
Title:	ION MILLING DEVICE

Patent #:	9330883	Issue Dt:	05/03/2016	Application #:	14382165	Filing Dt:	08/29/2014
Publication #:	US20150014529	Pub Dt:	01/15/2015
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	9804094	Issue Dt:	10/31/2017	Application #:	14383119	Filing Dt:	09/05/2014
Publication #:	US20150015880	Pub Dt:	01/15/2015
Title:	PLASMA SPECTROMETER

Patent #:	9377445	Issue Dt:	06/28/2016	Application #:	14383607	Filing Dt:	09/08/2014
Publication #:	US20150102232	Pub Dt:	04/16/2015
Title:	IONIZATION METHOD, IONIZATION APPARATUS, AND MASS ANALYSIS SYSTEM

Patent #:	9792832	Issue Dt:	10/17/2017	Application #:	14385239	Filing Dt:	09/15/2014
Publication #:	US20150074523	Pub Dt:	03/12/2015
Title:	CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OPERATION PROGRAM

Patent #:	9443694	Issue Dt:	09/13/2016	Application #:	14385256	Filing Dt:	09/15/2014
Publication #:	US20150076348	Pub Dt:	03/19/2015
Title:	CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OPERATION PROGRAM

Patent #:	9018597	Issue Dt:	04/28/2015	Application #:	14390071	Filing Dt:	10/02/2014
Publication #:	US20150041650	Pub Dt:	02/12/2015
Title:	GAS FIELD IONIZATION ION SOURCE AND ION BEAM APPARATUS

Patent #:	9337822	Issue Dt:	05/10/2016	Application #:	14390096	Filing Dt:	10/02/2014
Publication #:	US20150108340	Pub Dt:	04/23/2015
Title:	SWITCH CIRCUIT, MASS SPECTROMETER, AND CONTROL METHOD FOR SWITCH CIRCUIT

Patent #:	9429507	Issue Dt:	08/30/2016	Application #:	14390276	Filing Dt:	10/02/2014
Publication #:	US20150072350	Pub Dt:	03/12/2015
Title:	Flow Cell, Analysis Equipment and Analysis Method Using Same

Patent #:	9236220	Issue Dt:	01/12/2016	Application #:	14390409	Filing Dt:	10/03/2014
Publication #:	US20150041644	Pub Dt:	02/12/2015
Title:	ELECTRONIC MICROSCOPE, SETTING METHOD OF OBSERVATION CONDITION OF ELECTRONIC MICROSCOPE, AND OBSERVATION METHOD USING ELECTRONIC MICROSCOPE

Patent #:	NONE	Issue Dt:		Application #:	14390434	Filing Dt:	10/03/2014
Publication #:	US20150044096	Pub Dt:	02/12/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9355814	Issue Dt:	05/31/2016	Application #:	14390583	Filing Dt:	10/03/2014
Publication #:	US20150083910	Pub Dt:	03/26/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9791380	Issue Dt:	10/17/2017	Application #:	14391338	Filing Dt:	10/08/2014
Publication #:	US20150109434	Pub Dt:	04/23/2015
Title:	INSPECTION DEVICE AND IMAGE CAPTURE ELEMENT

Patent #:	9040937	Issue Dt:	05/26/2015	Application #:	14391671	Filing Dt:	10/09/2014
Publication #:	US20150060667	Pub Dt:	03/05/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9263232	Issue Dt:	02/16/2016	Application #:	14395263	Filing Dt:	10/17/2014
Publication #:	US20150129763	Pub Dt:	05/14/2015
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	9881365	Issue Dt:	01/30/2018	Application #:	14395999	Filing Dt:	10/21/2014
Publication #:	US20150213596	Pub Dt:	07/30/2015
Title:	SEMICONDUCTOR DEFECT CATEGORIZATION DEVICE AND PROGRAM FOR SEMICONDUCTOR DEFECT CATEGORIZATION DEVICE

Patent #:	9105453	Issue Dt:	08/11/2015	Application #:	14396228	Filing Dt:	10/22/2014
Publication #:	US20150108341	Pub Dt:	04/23/2015
Title:	MASS SPECTROMETER AND MASS SPECTROMETRY

Patent #:	9312091	Issue Dt:	04/12/2016	Application #:	14396769	Filing Dt:	10/24/2014
Publication #:	US20150076362	Pub Dt:	03/19/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9329136	Issue Dt:	05/03/2016	Application #:	14396908	Filing Dt:	10/24/2014
Publication #:	US20150146200	Pub Dt:	05/28/2015
Title:	DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Patent #:	9040911	Issue Dt:	05/26/2015	Application #:	14397079	Filing Dt:	10/24/2014
Publication #:	US20150108351	Pub Dt:	04/23/2015
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9476894	Issue Dt:	10/25/2016	Application #:	14398477	Filing Dt:	11/03/2014
Publication #:	US20150111299	Pub Dt:	04/23/2015
Title:	CENTRIFUGE MODULE, PREPROCESSING SYSTEM HAVING CENTRIFUGE MODULE, AND CONTROL METHOD FOR THE SYSTEM

Patent #:	9582875	Issue Dt:	02/28/2017	Application #:	14400341	Filing Dt:	11/11/2014
Publication #:	US20150139531	Pub Dt:	05/21/2015
Title:	DEFECT ANALYSIS ASSISTANCE DEVICE, PROGRAM EXECUTED BY DEFECT ANALYSIS ASSISTANCE DEVICE, AND DEFECT ANALYSIS SYSTEM

Patent #:	9535009	Issue Dt:	01/03/2017	Application #:	14401455	Filing Dt:	11/14/2014
Publication #:	US20150131087	Pub Dt:	05/14/2015
Title:	INSPECTION SYSTEM

Patent #:	9506940	Issue Dt:	11/29/2016	Application #:	14402416	Filing Dt:	11/20/2014
Publication #:	US20150147230	Pub Dt:	05/28/2015
Title:	AUTOMATIC ANALYSIS APPARATUS

Patent #:	9696329	Issue Dt:	07/04/2017	Application #:	14402906	Filing Dt:	11/21/2014
Publication #:	US20150104351	Pub Dt:	04/16/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9188554	Issue Dt:	11/17/2015	Application #:	14403668	Filing Dt:	11/25/2014
Publication #:	US20150212019	Pub Dt:	07/30/2015
Title:	PATTERN INSPECTION DEVICE AND PATTERN INSPECTION METHOD

Patent #:	9536170	Issue Dt:	01/03/2017	Application #:	14404499	Filing Dt:	11/28/2014
Publication #:	US20150110406	Pub Dt:	04/23/2015
Title:	MEASUREMENT METHOD, IMAGE PROCESSING DEVICE, AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	9129773	Issue Dt:	09/08/2015	Application #:	14406415	Filing Dt:	12/08/2014
Publication #:	US20150144804	Pub Dt:	05/28/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9324540	Issue Dt:	04/26/2016	Application #:	14407117	Filing Dt:	12/11/2014
Publication #:	US20150136979	Pub Dt:	05/21/2015
Title:	Charged Particle Beam Device

Patent #:	9322711	Issue Dt:	04/26/2016	Application #:	14407768	Filing Dt:	12/12/2014
Publication #:	US20150153223	Pub Dt:	06/04/2015
Title:	LIGHT SIGNAL DETECTING CIRCUIT, LIGHT AMOUNT DETECTING DEVICE, AND CHARGED PARTICLE BEAM DEVICE

Patent #:	9696150	Issue Dt:	07/04/2017	Application #:	14407896	Filing Dt:	12/12/2014
Publication #:	US20150136976	Pub Dt:	05/21/2015
Title:	OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM

Patent #:	9897624	Issue Dt:	02/20/2018	Application #:	14410113	Filing Dt:	12/22/2014
Publication #:	US20150323557	Pub Dt:	11/12/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9543112	Issue Dt:	01/10/2017	Application #:	14410235	Filing Dt:	12/22/2014
Publication #:	US20150340199	Pub Dt:	11/26/2015
Title:	Specimen Cryo Holder and Dewar

Patent #:	9627171	Issue Dt:	04/18/2017	Application #:	14410999	Filing Dt:	12/23/2014
Publication #:	US20150357153	Pub Dt:	12/10/2015
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	9360404	Issue Dt:	06/07/2016	Application #:	14411162	Filing Dt:	12/24/2014
Publication #:	US20150192505	Pub Dt:	07/09/2015
Title:	Filtering Member and Filtering Method

Patent #:	9683942	Issue Dt:	06/20/2017	Application #:	14411271	Filing Dt:	12/24/2014
Publication #:	US20150253250	Pub Dt:	09/10/2015
Title:	Luminescence Measuring Device

Patent #:	9171695	Issue Dt:	10/27/2015	Application #:	14411286	Filing Dt:	12/24/2014
Publication #:	US20150206704	Pub Dt:	07/23/2015
Title:	STAGE APPARATUS AND SAMPLE OBSERVATION APPARATUS

Patent #:	10168345	Issue Dt:	01/01/2019	Application #:	14411304	Filing Dt:	12/24/2014
Publication #:	US20150160251	Pub Dt:	06/11/2015
Title:	Automatic Analysis Apparatus and Sample Measuring Method

Patent #:	9964539	Issue Dt:	05/08/2018	Application #:	14412949	Filing Dt:	01/05/2015
Publication #:	US20150153335	Pub Dt:	06/04/2015
Title:	ANALYSIS DEVICE AND ANALYSIS METHOD

Patent #:	9650626	Issue Dt:	05/16/2017	Application #:	14412971	Filing Dt:	01/05/2015
Publication #:	US20150225714	Pub Dt:	08/13/2015
Title:	KIT FOR NUCLEIC ACID EXTRACTION AND A NUCLEIC ACID EXTRACTOR

Patent #:	10545017	Issue Dt:	01/28/2020	Application #:	14413198	Filing Dt:	01/06/2015
Publication #:	US20150285627	Pub Dt:	10/08/2015
Title:	OVERLAY ERROR MEASURING DEVICE AND COMPUTER PROGRAM FOR CAUSING COMPUTER TO MEASURE PATTERN

Patent #:	9709586	Issue Dt:	07/18/2017	Application #:	14413286	Filing Dt:	01/07/2015
Publication #:	US20150192600	Pub Dt:	07/09/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9638640	Issue Dt:	05/02/2017	Application #:	14413447	Filing Dt:	01/08/2015
Publication #:	US20150204794	Pub Dt:	07/23/2015
Title:	AUTOMATIC ANALYER

Patent #:	9618526	Issue Dt:	04/11/2017	Application #:	14413578	Filing Dt:	01/08/2015
Publication #:	US20150153370	Pub Dt:	06/04/2015
Title:	AUTOMATED ANALYZER

Patent #:	9557264	Issue Dt:	01/31/2017	Application #:	14414782	Filing Dt:	01/14/2015
Publication #:	US20150219556	Pub Dt:	08/06/2015
Title:	AUTOMATIC ANALYSIS DEVICE, AND AUTOMATIC ANALYSIS METHOD

Patent #:	9601321	Issue Dt:	03/21/2017	Application #:	14415226	Filing Dt:	01/16/2015
Publication #:	US20150206728	Pub Dt:	07/23/2015
Title:	MASS SPECTROMETER AND METHOD

Patent #:	9658237	Issue Dt:	05/23/2017	Application #:	14415300	Filing Dt:	01/16/2015
Publication #:	US20150185242	Pub Dt:	07/02/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9415391	Issue Dt:	08/16/2016	Application #:	14416084	Filing Dt:	01/21/2015
Publication #:	US20150151295	Pub Dt:	06/04/2015
Title:	CARTRIDGE FOR BIOCHEMICAL USE AND BIOCHEMICAL PROCESSING DEVICE

Patent #:	9657286	Issue Dt:	05/23/2017	Application #:	14416146	Filing Dt:	01/21/2015
Publication #:	US20150210999	Pub Dt:	07/30/2015
Title:	PRE-PROCESSING/ELECTROPHORESIS INTEGRATED CARTRIDGE, PRE-PROCESSING INTEGRATED CAPILLARY ELECTROPHORESIS DEVICE, AND PRE-PROCESSING INTEGRATED CAPILLARY ELECTROPHORESIS METHOD

Patent #:	10031147	Issue Dt:	07/24/2018	Application #:	14416376	Filing Dt:	01/22/2015
Publication #:	US20150260742	Pub Dt:	09/17/2015
Title:	AUTOMATIC ANALYZER AND MAINTENANCE SUPPORTING SYSTEM

Patent #:	9759669	Issue Dt:	09/12/2017	Application #:	14416752	Filing Dt:	01/23/2015
Publication #:	US20150177161	Pub Dt:	06/25/2015
Title:	INSPECTION DEVICE

Patent #:	9597612	Issue Dt:	03/21/2017	Application #:	14416787	Filing Dt:	01/23/2015
Publication #:	US20150182877	Pub Dt:	07/02/2015
Title:	ANALYSIS DEVICE INCLUDING SOLID-PHASE EXTRACTION MATERIAL FILLING AND DISCHARGING MECHANISMS

Patent #:	9378922	Issue Dt:	06/28/2016	Application #:	14417345	Filing Dt:	01/26/2015
Publication #:	US20150179396	Pub Dt:	06/25/2015
Title:	ELECTRON MICROSCOPE AND ELECTRON MICROSCOPE SAMPLE RETAINING DEVICE

Patent #:	9619727	Issue Dt:	04/11/2017	Application #:	14417425	Filing Dt:	01/26/2015
Publication #:	US20150199583	Pub Dt:	07/16/2015
Title:	Matching Process Device, Matching Process Method, and Inspection Device Employing Same

Patent #:	9177757	Issue Dt:	11/03/2015	Application #:	14417647	Filing Dt:	01/27/2015
Publication #:	US20150170875	Pub Dt:	06/18/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9841413	Issue Dt:	12/12/2017	Application #:	14417841	Filing Dt:	01/28/2015
Publication #:	US20150198579	Pub Dt:	07/16/2015
Title:	DATA PROCESSING DEVICE AND AUTOMATIC ANALYSIS DEVICE USING SAME

Patent #:	9759681	Issue Dt:	09/12/2017	Application #:	14418480	Filing Dt:	01/30/2015
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Title:	BIOMOLECULE DETECTION METHOD, BIOMOLECULE DETECTION DEVICE AND ANALYSIS DEVICE

Patent #:	9891240	Issue Dt:	02/13/2018	Application #:	14418614	Filing Dt:	01/30/2015
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Title:	AUTOMATIC ANALYZER

Patent #:	9823243	Issue Dt:	11/21/2017	Application #:	14418990	Filing Dt:	02/02/2015
Publication #:	US20150212082	Pub Dt:	07/30/2015
Title:	IMMUNOANALYSIS METHOD AND IMMUNOANALYSIS DEVICE

100

Patent #:	9362083	Issue Dt:	06/07/2016	Application #:	14420942	Filing Dt:	02/11/2015
Publication #:	US20150221470	Pub Dt:	08/06/2015
Title:	Charged Particle Beam Apparatus and Sample Observation Method

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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