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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 16 of 23
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Patent #:	9770713	Issue Dt:	09/26/2017	Application #:	14421239	Filing Dt:	02/12/2015
Publication #:	US20150202618	Pub Dt:	07/23/2015
Title:	NUCLEIC ACID ANALYSIS DEVICE

Patent #:	9240305	Issue Dt:	01/19/2016	Application #:	14422186	Filing Dt:	02/18/2015
Publication #:	US20150235803	Pub Dt:	08/20/2015
Title:	Charged Particle Beam Device and Sample Observation Method

Patent #:	9829430	Issue Dt:	11/28/2017	Application #:	14422276	Filing Dt:	02/18/2015
Publication #:	US20150247793	Pub Dt:	09/03/2015
Title:	SPECTROPHOTOMETER

Patent #:	9335335	Issue Dt:	05/10/2016	Application #:	14422278	Filing Dt:	02/18/2015
Publication #:	US20150219680	Pub Dt:	08/06/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9478389	Issue Dt:	10/25/2016	Application #:	14422374	Filing Dt:	02/19/2015
Publication #:	US20150221468	Pub Dt:	08/06/2015
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	9484182	Issue Dt:	11/01/2016	Application #:	14422423	Filing Dt:	02/19/2015
Publication #:	US20150235801	Pub Dt:	08/20/2015
Title:	CHARGED-PARTICLE-BEAM DEVICE AND METHOD FOR CORRECTING ABERRATION

Patent #:	9466457	Issue Dt:	10/11/2016	Application #:	14422531	Filing Dt:	02/19/2015
Publication #:	US20150228448	Pub Dt:	08/13/2015
Title:	Observation Apparatus and Optical Axis Adjustment Method

Patent #:	9418818	Issue Dt:	08/16/2016	Application #:	14422552	Filing Dt:	02/19/2015
Publication #:	US20150228447	Pub Dt:	08/13/2015
Title:	Charged Particle Beam Device and Sample Observation Method

Patent #:	9523648	Issue Dt:	12/20/2016	Application #:	14422583	Filing Dt:	02/19/2015
Publication #:	US20150241361	Pub Dt:	08/27/2015
Title:	Defect Inspection Device and Defect Inspection Method

Patent #:	9589343	Issue Dt:	03/07/2017	Application #:	14422603	Filing Dt:	02/19/2015
Publication #:	US20150243008	Pub Dt:	08/27/2015
Title:	PATTERN MEASUREMENT DEVICE, EVALUATION METHOD OF POLYMER COMPOUNDS USED IN SELF-ASSEMBLY LITHOGRAPHY, AND COMPUTER PROGRAM

Patent #:	9696330	Issue Dt:	07/04/2017	Application #:	14422716	Filing Dt:	02/20/2015
Publication #:	US20150233955	Pub Dt:	08/20/2015
Title:	SAMPLE CONVEYOR APPARATUS AND SPECIMEN TESTING AUTOMATION SYSTEM

Patent #:	9952239	Issue Dt:	04/24/2018	Application #:	14422717	Filing Dt:	02/20/2015
Publication #:	US20150192598	Pub Dt:	07/09/2015
Title:	SAMPLE INSPECTION AUTOMATION SYSTEM AND SAMPLE TRANSFER METHOD

Patent #:	9355815	Issue Dt:	05/31/2016	Application #:	14423081	Filing Dt:	02/20/2015
Publication #:	US20150214002	Pub Dt:	07/30/2015
Title:	ELECTRON MICROSCOPE AND ELECTRON BEAM DETECTOR

Patent #:	9842723	Issue Dt:	12/12/2017	Application #:	14423091	Filing Dt:	02/20/2015
Publication #:	US20150214000	Pub Dt:	07/30/2015
Title:	DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD

Patent #:	9857389	Issue Dt:	01/02/2018	Application #:	14423473	Filing Dt:	02/24/2015
Publication #:	US20160202279	Pub Dt:	07/14/2016
Title:	SPECIMEN STORAGE APPARATUS, SPECIMEN PROCESSING SYSTEM, AND CONTROLLING METHOD THEREOF

Patent #:	9251996	Issue Dt:	02/02/2016	Application #:	14431061	Filing Dt:	03/25/2015
Publication #:	US20150228449	Pub Dt:	08/13/2015
Title:	Charged Particle Beam Device, Position Adjusting Method for Diaphragm, and Diaphragm Position Adjusting Jig

Patent #:	9858659	Issue Dt:	01/02/2018	Application #:	14433698	Filing Dt:	04/06/2015
Publication #:	US20150228063	Pub Dt:	08/13/2015
Title:	Pattern Inspecting and Measuring Device and Program

Patent #:	9368319	Issue Dt:	06/14/2016	Application #:	14433886	Filing Dt:	04/07/2015
Publication #:	US20150279609	Pub Dt:	10/01/2015
Title:	Method for Removing Foreign Substances in Charged Particle Beam Device, and Charged Particle Beam Device

Patent #:	9685301	Issue Dt:	06/20/2017	Application #:	14433891	Filing Dt:	04/07/2015
Publication #:	US20150279614	Pub Dt:	10/01/2015
Title:	Charged-Particle Radiation Apparatus

Patent #:	9362088	Issue Dt:	06/07/2016	Application #:	14434687	Filing Dt:	04/09/2015
Publication #:	US20150255250	Pub Dt:	09/10/2015
Title:	Charged Particle Beam Device and Sample Preparation Method

Patent #:	10074506	Issue Dt:	09/11/2018	Application #:	14434824	Filing Dt:	04/10/2015
Publication #:	US20150255240	Pub Dt:	09/10/2015
Title:	Method for Manufacturing Electron Source

Patent #:	9224575	Issue Dt:	12/29/2015	Application #:	14435203	Filing Dt:	04/13/2015
Publication #:	US20150287569	Pub Dt:	10/08/2015
Title:	Charged Particle Beam Device and Overlay Misalignment Measurement Method

Patent #:	NONE	Issue Dt:		Application #:	14436097	Filing Dt:	04/16/2015
Publication #:	US20150269513	Pub Dt:	09/24/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9776185	Issue Dt:	10/03/2017	Application #:	14437951	Filing Dt:	04/23/2015
Publication #:	US20150290645	Pub Dt:	10/15/2015
Title:	REAGENT CONTAINER AND AUTOMATIC ANALYSIS APPARATUS

Patent #:	9784754	Issue Dt:	10/10/2017	Application #:	14437974	Filing Dt:	04/23/2015
Publication #:	US20150293134	Pub Dt:	10/15/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9778274	Issue Dt:	10/03/2017	Application #:	14438250	Filing Dt:	04/24/2015
Publication #:	US20150293136	Pub Dt:	10/15/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9564288	Issue Dt:	02/07/2017	Application #:	14438691	Filing Dt:	04/27/2015
Publication #:	US20150255244	Pub Dt:	09/10/2015
Title:	Sample Storage Container, Charged Particle Beam Apparatus, and Image Acquiring Method

Patent #:	9384940	Issue Dt:	07/05/2016	Application #:	14439628	Filing Dt:	04/29/2015
Publication #:	US20150294833	Pub Dt:	10/15/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9470346	Issue Dt:	10/18/2016	Application #:	14441611	Filing Dt:	05/08/2015
Publication #:	US20150285414	Pub Dt:	10/08/2015
Title:	PIPE CONNECTION JOINT

Patent #:	9683946	Issue Dt:	06/20/2017	Application #:	14441742	Filing Dt:	05/08/2015
Publication #:	US20150276622	Pub Dt:	10/01/2015
Title:	METHOD AND DEVICE FOR DETECTING DEFECTS AND METHOD AND DEVICE FOR OBSERVING DEFECTS

Patent #:	9852897	Issue Dt:	12/26/2017	Application #:	14442199	Filing Dt:	05/12/2015
Publication #:	US20160300703	Pub Dt:	10/13/2016
Title:	HYBRID ION SOURCE, MASS SPECTROMETER, AND ION MOBILITY DEVICE

Patent #:	9472375	Issue Dt:	10/18/2016	Application #:	14443293	Filing Dt:	05/15/2015
Publication #:	US20150311033	Pub Dt:	10/29/2015
Title:	Charged Particle Beam Device, Sample Stage Unit, and Sample Observation Method

Patent #:	9543053	Issue Dt:	01/10/2017	Application #:	14445056	Filing Dt:	07/29/2014
Publication #:	US20150034836	Pub Dt:	02/05/2015
Title:	ELECTRON BEAM EQUIPMENT

Patent #:	9006654	Issue Dt:	04/14/2015	Application #:	14447589	Filing Dt:	07/30/2014
Publication #:	US20150034835	Pub Dt:	02/05/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	10229813	Issue Dt:	03/12/2019	Application #:	14447608	Filing Dt:	07/30/2014
Publication #:	US20150311040	Pub Dt:	10/29/2015
Title:	PLASMA PROCESSING APPARATUS WITH LATTICE-LIKE FARADAY SHIELDS

Patent #:	9281470	Issue Dt:	03/08/2016	Application #:	14447614	Filing Dt:	07/31/2014
Publication #:	US20150349245	Pub Dt:	12/03/2015
Title:	PLASMA PROCESSING METHOD

Patent #:	9449842	Issue Dt:	09/20/2016	Application #:	14447615	Filing Dt:	07/31/2014
Publication #:	US20150194315	Pub Dt:	07/09/2015
Title:	PLASMA ETCHING METHOD

Patent #:	10073818	Issue Dt:	09/11/2018	Application #:	14447692	Filing Dt:	07/31/2014
Publication #:	US20150154145	Pub Dt:	06/04/2015
Title:	DATA PROCESSING METHOD, DATA PROCESSING APPARATUS AND PROCESSING APPARATUS

Patent #:	9905431	Issue Dt:	02/27/2018	Application #:	14448709	Filing Dt:	07/31/2014
Publication #:	US20150221518	Pub Dt:	08/06/2015
Title:	DRY ETCHING METHOD

Patent #:	9824866	Issue Dt:	11/21/2017	Application #:	14449516	Filing Dt:	08/01/2014
Publication #:	US20140339193	Pub Dt:	11/20/2014
Title:	Plasma Processing Method

Patent #:	9349603	Issue Dt:	05/24/2016	Application #:	14452578	Filing Dt:	08/06/2014
Publication #:	US20140349418	Pub Dt:	11/27/2014
Title:	PLASMA PROCESSING METHOD

Patent #:	9520266	Issue Dt:	12/13/2016	Application #:	14455878	Filing Dt:	08/09/2014
Publication #:	US20150041648	Pub Dt:	02/12/2015
Title:	PATTERN CRITICAL DIMENSION MEASUREMENT EQUIPMENT AND METHOD FOR MEASURING PATTERN CRITICAL DIMENSION

Patent #:	9153418	Issue Dt:	10/06/2015	Application #:	14461051	Filing Dt:	08/15/2014
Publication #:	US20150076349	Pub Dt:	03/19/2015
Title:	CHARGED PARTICLE RADIATION APPARATUS

Patent #:	9368320	Issue Dt:	06/14/2016	Application #:	14463263	Filing Dt:	08/19/2014
Publication #:	US20150053857	Pub Dt:	02/26/2015
Title:	STAGE APPARATUS, AND CHARGED PARTICLE BEAM APPARATUS USING SAME

Patent #:	9541531	Issue Dt:	01/10/2017	Application #:	14477989	Filing Dt:	09/05/2014
Publication #:	US20150090014	Pub Dt:	04/02/2015
Title:	DETECTOR FOR LIQUID CHROMATOGRAPHY

Patent #:	9023282	Issue Dt:	05/05/2015	Application #:	14484384	Filing Dt:	09/12/2014
Publication #:	US20140377853	Pub Dt:	12/25/2014
Title:	AUTOMATIC ANALYZER

Patent #:	9171704	Issue Dt:	10/27/2015	Application #:	14491298	Filing Dt:	09/19/2014
Publication #:	US20150041641	Pub Dt:	02/12/2015
Title:	MASS SPECTROMETER

Patent #:	9523114	Issue Dt:	12/20/2016	Application #:	14508338	Filing Dt:	10/07/2014
Publication #:	US20150024401	Pub Dt:	01/22/2015
Title:	ANALYZER

Patent #:	9230782	Issue Dt:	01/05/2016	Application #:	14508859	Filing Dt:	10/07/2014
Publication #:	US20150020970	Pub Dt:	01/22/2015
Title:	PLASMA PROCESSING METHOD AND APPARATUS

Patent #:	9496147	Issue Dt:	11/15/2016	Application #:	14509935	Filing Dt:	10/08/2014
Publication #:	US20150024599	Pub Dt:	01/22/2015
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9704731	Issue Dt:	07/11/2017	Application #:	14514587	Filing Dt:	10/15/2014
Publication #:	US20150031213	Pub Dt:	01/29/2015
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9489610	Issue Dt:	11/08/2016	Application #:	14515701	Filing Dt:	10/16/2014
Publication #:	US20150028109	Pub Dt:	01/29/2015
Title:	ORIENTATION IDENTIFICATION LABEL, REAGENT CONTAINER CARRIER STRUCTURE, ANALYZER DEVICE AND READER MODULE

Patent #:	9933370	Issue Dt:	04/03/2018	Application #:	14516490	Filing Dt:	10/16/2014
Publication #:	US20150109435	Pub Dt:	04/23/2015
Title:	INSPECTION APPARATUS

Patent #:	9194795	Issue Dt:	11/24/2015	Application #:	14551230	Filing Dt:	11/24/2014
Publication #:	US20150102229	Pub Dt:	04/16/2015
Title:	DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

Patent #:	9105442	Issue Dt:	08/11/2015	Application #:	14552477	Filing Dt:	11/24/2014
Publication #:	US20150076347	Pub Dt:	03/19/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9206462	Issue Dt:	12/08/2015	Application #:	14556603	Filing Dt:	12/01/2014
Publication #:	US20150087017	Pub Dt:	03/26/2015
Title:	DEVICE FOR BACTERIA CLASSIFICATION AND PRETREATMENT DEVICE FOR BACTERIA TEST

Patent #:	9343336	Issue Dt:	05/17/2016	Application #:	14557838	Filing Dt:	12/02/2014
Publication #:	US20150083329	Pub Dt:	03/26/2015
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9236217	Issue Dt:	01/12/2016	Application #:	14562260	Filing Dt:	12/05/2014
Publication #:	US20150083908	Pub Dt:	03/26/2015
Title:	INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERVATION METHOD

Patent #:	9940184	Issue Dt:	04/10/2018	Application #:	14568268	Filing Dt:	12/12/2014
Publication #:	US20150169393	Pub Dt:	06/18/2015
Title:	ANOMALY DETECTING METHOD, AND APPARATUS FOR THE SAME

Patent #:	9318299	Issue Dt:	04/19/2016	Application #:	14573965	Filing Dt:	12/17/2014
Publication #:	US20150102221	Pub Dt:	04/16/2015
Title:	CHARGED PARTICLE BEAM DEVICE HAVING AN ENERGY FILTER

Patent #:	9709585	Issue Dt:	07/18/2017	Application #:	14577379	Filing Dt:	12/19/2014
Publication #:	US20150175316	Pub Dt:	06/25/2015
Title:	TRANSPORT LINE COVER

Patent #:	NONE	Issue Dt:		Application #:	14578619	Filing Dt:	12/22/2014
Publication #:	US20150111300	Pub Dt:	04/23/2015
Title:	APPARATUS FOR PRETREATING BIOLOGICAL SAMPLES, AND MASS SPECTROMETER EQUIPPED WITH SAME

Patent #:	9217718	Issue Dt:	12/22/2015	Application #:	14587271	Filing Dt:	12/31/2014
Publication #:	US20150116712	Pub Dt:	04/30/2015
Title:	DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE PROVIDED WITH SAME

Patent #:	10027747	Issue Dt:	07/17/2018	Application #:	14596604	Filing Dt:	01/14/2015
Publication #:	US20150127707	Pub Dt:	05/07/2015
Title:	TERMINAL COMMUNICATION APPARATUS, AND DISTRIBUTED CONTROL SYSTEM

Patent #:	10121640	Issue Dt:	11/06/2018	Application #:	14603187	Filing Dt:	01/22/2015
Publication #:	US20150170880	Pub Dt:	06/18/2015
Title:	METHOD AND APPARATUS FOR PLASMA PROCESSING

Patent #:	9378929	Issue Dt:	06/28/2016	Application #:	14603246	Filing Dt:	01/22/2015
Publication #:	US20150221477	Pub Dt:	08/06/2015
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9287084	Issue Dt:	03/15/2016	Application #:	14607736	Filing Dt:	01/28/2015
Publication #:	US20150248944	Pub Dt:	09/03/2015
Title:	ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE SAME

Patent #:	9502217	Issue Dt:	11/22/2016	Application #:	14609807	Filing Dt:	01/30/2015
Publication #:	US20150144594	Pub Dt:	05/28/2015
Title:	Plasma Processing Apparatus and Plasma Processing Method

Patent #:	9245711	Issue Dt:	01/26/2016	Application #:	14613538	Filing Dt:	02/04/2015
Publication #:	US20150221471	Pub Dt:	08/06/2015
Title:	Charged Particle Beam Apparatus and Image Forming Method

Patent #:	9287082	Issue Dt:	03/15/2016	Application #:	14616658	Filing Dt:	02/07/2015
Publication #:	US20150228443	Pub Dt:	08/13/2015
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	9324588	Issue Dt:	04/26/2016	Application #:	14625855	Filing Dt:	02/19/2015
Publication #:	US20160020123	Pub Dt:	01/21/2016
Title:	DATA ANALYSIS METHOD FOR PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

Patent #:	9627173	Issue Dt:	04/18/2017	Application #:	14626041	Filing Dt:	02/19/2015
Publication #:	US20150248991	Pub Dt:	09/03/2015
Title:	Stage Device and Charged Particle Beam Apparatus Using the Stage Device

Patent #:	9401297	Issue Dt:	07/26/2016	Application #:	14626116	Filing Dt:	02/19/2015
Publication #:	US20150262857	Pub Dt:	09/17/2015
Title:	Electrostatic Chuck Mechanism and Charged Particle Beam Apparatus

Patent #:	10037909	Issue Dt:	07/31/2018	Application #:	14626911	Filing Dt:	02/19/2015
Publication #:	US20160079107	Pub Dt:	03/17/2016
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9711375	Issue Dt:	07/18/2017	Application #:	14626921	Filing Dt:	02/19/2015
Publication #:	US20150371876	Pub Dt:	12/24/2015
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10103007	Issue Dt:	10/16/2018	Application #:	14626952	Filing Dt:	02/20/2015
Publication #:	US20160064189	Pub Dt:	03/03/2016
Title:	PLASMA PROCESSING APPARATUS WITH GAS FEED AND EVACUATION CONDUIT

Patent #:	10037868	Issue Dt:	07/31/2018	Application #:	14626958	Filing Dt:	02/20/2015
Publication #:	US20150279624	Pub Dt:	10/01/2015
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9310318	Issue Dt:	04/12/2016	Application #:	14638305	Filing Dt:	03/04/2015
Publication #:	US20150276623	Pub Dt:	10/01/2015
Title:	Defect Inspection Method and Defect Inspection Device

Patent #:	9365891	Issue Dt:	06/14/2016	Application #:	14642461	Filing Dt:	03/09/2015
Publication #:	US20150184227	Pub Dt:	07/02/2015
Title:	NUCLEIC ACID ANALYSIS DEVICE, METHOD FOR PRODUCING SAME, AND NUCLEIC ACID ANALYZER

Patent #:	9281169	Issue Dt:	03/08/2016	Application #:	14643899	Filing Dt:	03/10/2015
Publication #:	US20150187554	Pub Dt:	07/02/2015
Title:	MASS SPECTROMETER

Patent #:	9494525	Issue Dt:	11/15/2016	Application #:	14646150	Filing Dt:	05/20/2015
Publication #:	US20150316531	Pub Dt:	11/05/2015
Title:	Automated Analyzer and Automated Analysis Method

Patent #:	9508527	Issue Dt:	11/29/2016	Application #:	14646159	Filing Dt:	05/20/2015
Publication #:	US20150318143	Pub Dt:	11/05/2015
Title:	SAMPLE BASE, CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

Patent #:	9581573	Issue Dt:	02/28/2017	Application #:	14646509	Filing Dt:	05/21/2015
Publication #:	US20150293064	Pub Dt:	10/15/2015
Title:	LIQUID CHROMATOGRAPH

Patent #:	9975308	Issue Dt:	05/22/2018	Application #:	14646522	Filing Dt:	05/21/2015
Publication #:	US20150314550	Pub Dt:	11/05/2015
Title:	GLASS/RESIN COMPOSITE STRUCTURE AND METHOD FOR MANUFACTURING SAME

Patent #:	9412557	Issue Dt:	08/09/2016	Application #:	14647323	Filing Dt:	05/26/2015
Publication #:	US20150325408	Pub Dt:	11/12/2015
Title:	CHARGED PARTICLE BEAM APPARATUS AND PROGRAM

Patent #:	9977041	Issue Dt:	05/22/2018	Application #:	14648355	Filing Dt:	05/29/2015
Publication #:	US20150293135	Pub Dt:	10/15/2015
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	10281439	Issue Dt:	05/07/2019	Application #:	14649336	Filing Dt:	06/03/2015
Publication #:	US20160216239	Pub Dt:	07/28/2016
Title:	METHOD OF TRANSMITTING CONTROL DATA FOR SYSTEM CONVERSION AMONG LIQUID CHROMATOGRAPHS

Patent #:	9569836	Issue Dt:	02/14/2017	Application #:	14650515	Filing Dt:	06/08/2015
Publication #:	US20150302568	Pub Dt:	10/22/2015
Title:	Defect Observation Method and Defect Observation Device

Patent #:	9846171	Issue Dt:	12/19/2017	Application #:	14651026	Filing Dt:	06/10/2015
Publication #:	US20150316570	Pub Dt:	11/05/2015
Title:	AUTOMATED ANALYZER

Patent #:	9835612	Issue Dt:	12/05/2017	Application #:	14651684	Filing Dt:	06/12/2015
Publication #:	US20150316532	Pub Dt:	11/05/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9811897	Issue Dt:	11/07/2017	Application #:	14652198	Filing Dt:	06/15/2015
Publication #:	US20150332445	Pub Dt:	11/19/2015
Title:	DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE

Patent #:	9970951	Issue Dt:	05/15/2018	Application #:	14652537	Filing Dt:	06/16/2015
Publication #:	US20150346228	Pub Dt:	12/03/2015
Title:	GENETIC TESTING DEVICE, GENETIC TESTING METHOD AND PROGRAM

Patent #:	9449790	Issue Dt:	09/20/2016	Application #:	14652624	Filing Dt:	10/19/2015
Publication #:	US20160035538	Pub Dt:	02/04/2016
Title:	Pattern Shape Evaluation Method, Semiconductor Device Manufacturing Method, and Pattern Shape Evaluation Device

Patent #:	9605300	Issue Dt:	03/28/2017	Application #:	14652922	Filing Dt:	06/17/2015
Publication #:	US20150337360	Pub Dt:	11/26/2015
Title:	DEVICE FOR GENOTYPIC ANALYSIS AND METHOD FOR GENOTYPIC ANALYSIS

Patent #:	9312099	Issue Dt:	04/12/2016	Application #:	14655081	Filing Dt:	06/24/2015
Publication #:	US20150348750	Pub Dt:	12/03/2015
Title:	CHARGED PARTICLE BEAM DEVICE AND METHOD FOR ANALYZING DEFECT THEREIN

Patent #:	10113962	Issue Dt:	10/30/2018	Application #:	14670861	Filing Dt:	03/27/2015
Publication #:	US20150198525	Pub Dt:	07/16/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9766401	Issue Dt:	09/19/2017	Application #:	14678027	Filing Dt:	04/03/2015
Publication #:	US20150286001	Pub Dt:	10/08/2015
Title:	Defect Review Apparatus and Method for Correcting Coordinate Misalignment Using Two Light Sources

Patent #:	9494611	Issue Dt:	11/15/2016	Application #:	14678168	Filing Dt:	04/03/2015
Publication #:	US20150212102	Pub Dt:	07/30/2015
Title:	IMMUNOLOGICAL ANALYZING APPARATUS

Patent #:	9997337	Issue Dt:	06/12/2018	Application #:	14727265	Filing Dt:	06/01/2015
Publication #:	US20150348763	Pub Dt:	12/03/2015
Title:	PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

100

Patent #:	9704687	Issue Dt:	07/11/2017	Application #:	14741324	Filing Dt:	06/16/2015
Publication #:	US20150364290	Pub Dt:	12/17/2015
Title:	CHARGED PARTICLE BEAM APPLICATION DEVICE

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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