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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 17 of 23
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Patent #:	9863969	Issue Dt:	01/09/2018	Application #:	14744117	Filing Dt:	06/19/2015
Publication #:	US20150285828	Pub Dt:	10/08/2015
Title:	METHOD OF EVAPORATION CONTROL OF A SAMPLE STORED IN A COLD CONTAINER

Patent #:	9502208	Issue Dt:	11/22/2016	Application #:	14747364	Filing Dt:	06/23/2015
Publication #:	US20160005568	Pub Dt:	01/07/2016
Title:	CHARGED PARTICLE BEAM APPARATUS, STAGE CONTROLLING METHOD, AND STAGE SYSTEM

Patent #:	9885670	Issue Dt:	02/06/2018	Application #:	14758054	Filing Dt:	06/26/2015
Publication #:	US20150346112	Pub Dt:	12/03/2015
Title:	Inspection Apparatus and Adjusting Method

Patent #:	9865046	Issue Dt:	01/09/2018	Application #:	14758063	Filing Dt:	06/26/2015
Publication #:	US20150356727	Pub Dt:	12/10/2015
Title:	DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

Patent #:	9368324	Issue Dt:	06/14/2016	Application #:	14759222	Filing Dt:	07/03/2015
Publication #:	US20150371819	Pub Dt:	12/24/2015
Title:	MEASUREMENT AND INSPECTION DEVICE

Patent #:	9543113	Issue Dt:	01/10/2017	Application #:	14759241	Filing Dt:	07/06/2015
Publication #:	US20150357156	Pub Dt:	12/10/2015
Title:	Charged-Particle Beam Device For Irradiating a Charged Particle Beam on a Sample

Patent #:	10451584	Issue Dt:	10/22/2019	Application #:	14759596	Filing Dt:	07/07/2015
Publication #:	US20150362458	Pub Dt:	12/17/2015
Title:	BIOMOLECULE MEASURING DEVICE

Patent #:	9443695	Issue Dt:	09/13/2016	Application #:	14759782	Filing Dt:	07/08/2015
Publication #:	US20150348747	Pub Dt:	12/03/2015
Title:	CHARGED-PARTICLE BEAM DEVICE

Patent #:	9823065	Issue Dt:	11/21/2017	Application #:	14759798	Filing Dt:	07/08/2015
Publication #:	US20150354947	Pub Dt:	12/10/2015
Title:	Surface Measurement Apparatus

Patent #:	10018586	Issue Dt:	07/10/2018	Application #:	14760032	Filing Dt:	07/09/2015
Publication #:	US20150355140	Pub Dt:	12/10/2015
Title:	ELECTROCHEMICAL MEASUREMENT DEVICE

Patent #:	9484181	Issue Dt:	11/01/2016	Application #:	14760053	Filing Dt:	07/09/2015
Publication #:	US20150357155	Pub Dt:	12/10/2015
Title:	Charged Particle Beam Apparatus and Trajectory Correction Method in Charged Particle Beam Apparatus

Patent #:	9502212	Issue Dt:	11/22/2016	Application #:	14760259	Filing Dt:	07/10/2015
Publication #:	US20150348748	Pub Dt:	12/03/2015
Title:	Charged Particle Beam Apparatus

Patent #:	9666408	Issue Dt:	05/30/2017	Application #:	14760268	Filing Dt:	07/10/2015
Publication #:	US20150340198	Pub Dt:	11/26/2015
Title:	APPARATUS AND METHOD FOR PROCESSING SAMPLE, AND CHARGED PARTICLE RADIATION APPARATUS

Patent #:	9831062	Issue Dt:	11/28/2017	Application #:	14760322	Filing Dt:	07/10/2015
Publication #:	US20150357158	Pub Dt:	12/10/2015
Title:	Method for Pattern Measurement, Method for Setting Device Parameters of Charged Particle Radiation Device, and Charged Particle Radiation Device

Patent #:	9722431	Issue Dt:	08/01/2017	Application #:	14760800	Filing Dt:	07/14/2015
Publication #:	US20150357824	Pub Dt:	12/10/2015
Title:	SPECIMEN PROCESSING SYSTEM

Patent #:	9575085	Issue Dt:	02/21/2017	Application #:	14760806	Filing Dt:	07/14/2015
Publication #:	US20150346230	Pub Dt:	12/03/2015
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	9891241	Issue Dt:	02/13/2018	Application #:	14760818	Filing Dt:	07/14/2015
Publication #:	US20150346231	Pub Dt:	12/03/2015
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	9761409	Issue Dt:	09/12/2017	Application #:	14761963	Filing Dt:	07/20/2015
Publication #:	US20150364296	Pub Dt:	12/17/2015
Title:	Composite Charged Particle Beam Detector, Charged Particle Beam Device, and Charged Particle Beam Detector

Patent #:	10246675	Issue Dt:	04/02/2019	Application #:	14762301	Filing Dt:	07/21/2015
Publication #:	US20150361387	Pub Dt:	12/17/2015
Title:	BIOCHEMICAL CARTRIDGE, AND BIOCHEMICAL CARTRIDGE AND CARTRIDGE HOLDER SET

Patent #:	9786468	Issue Dt:	10/10/2017	Application #:	14762621	Filing Dt:	07/22/2015
Publication #:	US20150357154	Pub Dt:	12/10/2015
Title:	Charged Particle Beam Device

Patent #:	10192028	Issue Dt:	01/29/2019	Application #:	14762897	Filing Dt:	07/23/2015
Publication #:	US20150363549	Pub Dt:	12/17/2015
Title:	DATA ANALYSIS DEVICE AND METHOD THEREFOR

Patent #:	9418825	Issue Dt:	08/16/2016	Application #:	14762916	Filing Dt:	07/23/2015
Publication #:	US20150371837	Pub Dt:	12/24/2015
Title:	METHOD AND DEVICE FOR MASS SPECTROMETRY

Patent #:	9575083	Issue Dt:	02/21/2017	Application #:	14762922	Filing Dt:	07/23/2015
Publication #:	US20150369831	Pub Dt:	12/24/2015
Title:	AUTOMATIC ANALYSIS APPARATUS

Patent #:	9989550	Issue Dt:	06/05/2018	Application #:	14762928	Filing Dt:	07/23/2015
Publication #:	US20150369833	Pub Dt:	12/24/2015
Title:	AUTOMATED ANALYZING APPARATUS

Patent #:	10071385	Issue Dt:	09/11/2018	Application #:	14763187	Filing Dt:	07/24/2015
Publication #:	US20150360239	Pub Dt:	12/17/2015
Title:	CENTRIFUGING SYSTEM, SAMPLE PREPROCESSING SYSTEM, AND CONTROL METHOD

Patent #:	9857388	Issue Dt:	01/02/2018	Application #:	14763225	Filing Dt:	07/24/2015
Publication #:	US20150362514	Pub Dt:	12/17/2015
Title:	AUTOMATIC ANALYZER

Patent #:	10141159	Issue Dt:	11/27/2018	Application #:	14763363	Filing Dt:	07/24/2015
Publication #:	US20150371816	Pub Dt:	12/24/2015
Title:	SAMPLE OBSERVATION DEVICE HAVING A SELECTABLE ACCELERATION VOLTAGE

Patent #:	9601307	Issue Dt:	03/21/2017	Application #:	14764641	Filing Dt:	07/30/2015
Publication #:	US20150371814	Pub Dt:	12/24/2015
Title:	CHARGED PARTICLE RADIATION APPARATUS

Patent #:	9778206	Issue Dt:	10/03/2017	Application #:	14764985	Filing Dt:	07/31/2015
Publication #:	US20150369752	Pub Dt:	12/24/2015
Title:	DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Patent #:	9990708	Issue Dt:	06/05/2018	Application #:	14768600	Filing Dt:	08/18/2015
Publication #:	US20160005157	Pub Dt:	01/07/2016
Title:	Pattern-Measuring Apparatus and Semiconductor-Measuring System

Patent #:	10802017	Issue Dt:	10/13/2020	Application #:	14768771	Filing Dt:	08/19/2015
Publication #:	US20160003814	Pub Dt:	01/07/2016
Title:	BIOANALYSIS DEVICE AND BIOMOLECULE ANALYZER

Patent #:	9506154	Issue Dt:	11/29/2016	Application #:	14770082	Filing Dt:	08/24/2015
Publication #:	US20160138170	Pub Dt:	05/19/2016
Title:	PLASMA PROCESSING METHOD

Patent #:	9492821	Issue Dt:	11/15/2016	Application #:	14770978	Filing Dt:	08/27/2015
Publication #:	US20160016167	Pub Dt:	01/21/2016
Title:	LIQUID FEEDER AND CHEMICAL ANALYZER INCLUDING SAME

Patent #:	9329137	Issue Dt:	05/03/2016	Application #:	14773315	Filing Dt:	09/04/2015
Publication #:	US20160011123	Pub Dt:	01/14/2016
Title:	DEFECT INSPECTION METHOD AND DEVICE USING SAME

Patent #:	9922414	Issue Dt:	03/20/2018	Application #:	14773319	Filing Dt:	09/04/2015
Publication #:	US20160019682	Pub Dt:	01/21/2016
Title:	DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

Patent #:	10332736	Issue Dt:	06/25/2019	Application #:	14773902	Filing Dt:	09/09/2015
Publication #:	US20160020082	Pub Dt:	01/21/2016
Title:	MASS SPECTROMETER WITH ION FREQUENCY SELECTION

Patent #:	10241062	Issue Dt:	03/26/2019	Application #:	14774367	Filing Dt:	09/10/2015
Publication #:	US20160025659	Pub Dt:	01/28/2016
Title:	CHARGED PARTICLE BEAM DEVICE, SAMPLE OBSERVATION METHOD, SAMPLE PLATFORM, OBSERVATION SYSTEM, AND LIGHT EMITTING MEMBER

Patent #:	9459271	Issue Dt:	10/04/2016	Application #:	14775544	Filing Dt:	09/11/2015
Publication #:	US20160025758	Pub Dt:	01/28/2016
Title:	ANALYZER AND AUTOMATIC ANALYZER

Patent #:	9945993	Issue Dt:	04/17/2018	Application #:	14777546	Filing Dt:	09/16/2015
Publication #:	US20160282526	Pub Dt:	09/29/2016
Title:	CURVED GRATING, METHOD FOR MANUFACTURING THE SAME, AND OPTICAL DEVICE

Patent #:	9581609	Issue Dt:	02/28/2017	Application #:	14777550	Filing Dt:	09/16/2015
Publication #:	US20160291046	Pub Dt:	10/06/2016
Title:	AUTOMATIC COAGULATION ANALYZING APPARATUS AND ANALYZING METHOD

Patent #:	10083814	Issue Dt:	09/25/2018	Application #:	14781634	Filing Dt:	10/01/2015
Publication #:	US20160064183	Pub Dt:	03/03/2016
Title:	Electron Microscope and Sample Observation Method

Patent #:	10036737	Issue Dt:	07/31/2018	Application #:	14782424	Filing Dt:	10/05/2015
Publication #:	US20160025692	Pub Dt:	01/28/2016
Title:	ANALYSIS SYSTEM

Patent #:	9373480	Issue Dt:	06/21/2016	Application #:	14782695	Filing Dt:	10/06/2015
Publication #:	US20160071685	Pub Dt:	03/10/2016
Title:	Charged Particle Beam Device and Filter Member

Patent #:	9933447	Issue Dt:	04/03/2018	Application #:	14784359	Filing Dt:	10/14/2015
Publication #:	US20160061852	Pub Dt:	03/03/2016
Title:	AUTOMATIC ANALYZING DEVICE

Patent #:	9897622	Issue Dt:	02/20/2018	Application #:	14784424	Filing Dt:	10/14/2015
Publication #:	US20160069922	Pub Dt:	03/10/2016
Title:	AUTOMATIC ANALYZER

Patent #:	9536700	Issue Dt:	01/03/2017	Application #:	14786039	Filing Dt:	10/21/2015
Publication #:	US20160071688	Pub Dt:	03/10/2016
Title:	Sample Observation Device

Patent #:	9575082	Issue Dt:	02/21/2017	Application #:	14786234	Filing Dt:	10/22/2015
Publication #:	US20160077119	Pub Dt:	03/17/2016
Title:	AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Patent #:	9449786	Issue Dt:	09/20/2016	Application #:	14786446	Filing Dt:	10/22/2015
Publication #:	US20160071687	Pub Dt:	03/10/2016
Title:	CHARGED PARTICLE RADIATION DEVICE AND SPECIMEN PREPARATION METHOD USING SAID DEVICE

Patent #:	9349567	Issue Dt:	05/24/2016	Application #:	14787118	Filing Dt:	10/26/2015
Publication #:	US20160086766	Pub Dt:	03/24/2016
Title:	Charged Particle Beam Device

Patent #:	9570268	Issue Dt:	02/14/2017	Application #:	14787263	Filing Dt:	10/26/2015
Publication #:	US20160104597	Pub Dt:	04/14/2016
Title:	ELECTRON GUN, CHARGED PARTICLE GUN, AND CHARGED PARTICLE BEAM APPARATUS USING ELECTRON GUN AND CHARGED PARTICLE GUN

Patent #:	9799486	Issue Dt:	10/24/2017	Application #:	14796113	Filing Dt:	07/10/2015
Publication #:	US20160013010	Pub Dt:	01/14/2016
Title:	CHARGED PARTICLE BEAM APPARATUS FOR MEASURING SURFACE POTENTIAL OF A SAMPLE

Patent #:	9733194	Issue Dt:	08/15/2017	Application #:	14799741	Filing Dt:	07/15/2015
Publication #:	US20160018340	Pub Dt:	01/21/2016
Title:	METHOD FOR REVIEWING A DEFECT AND APPARATUS

Patent #:	9478392	Issue Dt:	10/25/2016	Application #:	14803304	Filing Dt:	07/20/2015
Publication #:	US20160064182	Pub Dt:	03/03/2016
Title:	CHARGED PARTICLE BEAM APPARATUS AND IMAGE GENERATION METHOD

Patent #:	9678021	Issue Dt:	06/13/2017	Application #:	14821075	Filing Dt:	08/07/2015
Publication #:	US20160041092	Pub Dt:	02/11/2016
Title:	METHOD AND APPARATUS FOR INSPECTING DEFECTS

Patent #:	10408762	Issue Dt:	09/10/2019	Application #:	14825098	Filing Dt:	08/12/2015
Publication #:	US20160225681	Pub Dt:	08/04/2016
Title:	PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD AND PLASMA PROCESSING ANALYSIS METHOD

Patent #:	10332760	Issue Dt:	06/25/2019	Application #:	14832239	Filing Dt:	08/21/2015
Publication #:	US20150357210	Pub Dt:	12/10/2015
Title:	METHOD FOR CONTROLLING PLASMA PROCESSING APPARATUS

Patent #:	10184182	Issue Dt:	01/22/2019	Application #:	14834389	Filing Dt:	08/24/2015
Publication #:	US20160155611	Pub Dt:	06/02/2016
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9741579	Issue Dt:	08/22/2017	Application #:	14846736	Filing Dt:	09/05/2015
Publication #:	US20160254163	Pub Dt:	09/01/2016
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9583314	Issue Dt:	02/28/2017	Application #:	14846739	Filing Dt:	09/05/2015
Publication #:	US20160141151	Pub Dt:	05/19/2016
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9797827	Issue Dt:	10/24/2017	Application #:	14850053	Filing Dt:	09/10/2015
Publication #:	US20150377771	Pub Dt:	12/31/2015
Title:	AUTOMATIC ANALYZER

Patent #:	9673020	Issue Dt:	06/06/2017	Application #:	14850085	Filing Dt:	09/10/2015
Publication #:	US20150380208	Pub Dt:	12/31/2015
Title:	CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE BEAM DEVICE, AND METHOD FOR INSPECTING OR OBSERVING SAMPLE

Patent #:	9865439	Issue Dt:	01/09/2018	Application #:	14851744	Filing Dt:	09/11/2015
Publication #:	US20160211186	Pub Dt:	07/21/2016
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9607874	Issue Dt:	03/28/2017	Application #:	14851996	Filing Dt:	09/11/2015
Publication #:	US20160079043	Pub Dt:	03/17/2016
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9741629	Issue Dt:	08/22/2017	Application #:	14852189	Filing Dt:	09/11/2015
Publication #:	US20160284610	Pub Dt:	09/29/2016
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10018585	Issue Dt:	07/10/2018	Application #:	14888271	Filing Dt:	10/30/2015
Publication #:	US20160054257	Pub Dt:	02/25/2016
Title:	Electrolyte Concentration Measuring Apparatus and Measuring Method Using Same

Patent #:	9390885	Issue Dt:	07/12/2016	Application #:	14888792	Filing Dt:	11/03/2015
Publication #:	US20160056014	Pub Dt:	02/25/2016
Title:	Superposition Measuring Apparatus, Superposition Measuring Method, and Superposition Measuring System

Patent #:	9972079	Issue Dt:	05/15/2018	Application #:	14889986	Filing Dt:	11/09/2015
Publication #:	US20160125590	Pub Dt:	05/05/2016
Title:	Wafer Appearance Inspection Apparatus

Patent #:	10041884	Issue Dt:	08/07/2018	Application #:	14890246	Filing Dt:	11/10/2015
Publication #:	US20160109368	Pub Dt:	04/21/2016
Title:	NUCLEIC ACID ANALYZER AND NUCLEIC ACID ANALYSIS METHOD USING SAME

Patent #:	9709588	Issue Dt:	07/18/2017	Application #:	14890253	Filing Dt:	11/10/2015
Publication #:	US20160124010	Pub Dt:	05/05/2016
Title:	AUTOMATIC ANALYZER

Patent #:	9631924	Issue Dt:	04/25/2017	Application #:	14890844	Filing Dt:	11/12/2015
Publication #:	US20160091304	Pub Dt:	03/31/2016
Title:	Surface Profile Measurement Method and Device Used Therein

Patent #:	9558912	Issue Dt:	01/31/2017	Application #:	14890936	Filing Dt:	11/13/2015
Publication #:	US20160126057	Pub Dt:	05/05/2016
Title:	ION MILLING DEVICE

Patent #:	9466460	Issue Dt:	10/11/2016	Application #:	14891494	Filing Dt:	11/16/2015
Publication #:	US20160126058	Pub Dt:	05/05/2016
Title:	CHARGED-PARTICLE-BEAM DEVICE AND SPECIMEN OBSERVATION METHOD

Patent #:	10290522	Issue Dt:	05/14/2019	Application #:	14893669	Filing Dt:	11/24/2015
Publication #:	US20160133433	Pub Dt:	05/12/2016
Title:	CONDUCTIVE INTERFACE SYSTEM BETWEEN VACUUM CHAMBERS IN A CHARGED PARTICLE BEAM DEVICE

Patent #:	9880182	Issue Dt:	01/30/2018	Application #:	14895030	Filing Dt:	12/01/2015
Publication #:	US20160146846	Pub Dt:	05/26/2016
Title:	AUTOMATIC ANALYZER

Patent #:	10234416	Issue Dt:	03/19/2019	Application #:	14896091	Filing Dt:	12/04/2015
Publication #:	US20160131611	Pub Dt:	05/12/2016
Title:	ANION SENSOR

Patent #:	9862921	Issue Dt:	01/09/2018	Application #:	14896123	Filing Dt:	12/04/2015
Publication #:	US20160122702	Pub Dt:	05/05/2016
Title:	METHOD FOR DETERMINING CELL STATE AND AUTOANALYZER USING SAID METHOD

Patent #:	10176968	Issue Dt:	01/08/2019	Application #:	14896753	Filing Dt:	12/08/2015
Publication #:	US20160118218	Pub Dt:	04/28/2016
Title:	METHOD FOR ADJUSTING CHARGED PARTICLE BEAM DEVICE AND ADJUSTING BEAM APERTURE BASED ON A SELECTED EMISSION CONDITION AND CHARGED PARTICLE BEAM DEVICE FOR SAME

Patent #:	9658063	Issue Dt:	05/23/2017	Application #:	14897609	Filing Dt:	12/10/2015
Publication #:	US20160123726	Pub Dt:	05/05/2016
Title:	METHOD AND DEVICE FOR LINE PATTERN SHAPE EVALUATION

Patent #:	9880082	Issue Dt:	01/30/2018	Application #:	14897795	Filing Dt:	12/11/2015
Publication #:	US20160109350	Pub Dt:	04/21/2016
Title:	DETECTION DEVICE THAT CALCULATES A CENTER OF GRAVITY OF A CONTAINER GAP REGION

Patent #:	9721773	Issue Dt:	08/01/2017	Application #:	14898158	Filing Dt:	12/14/2015
Publication #:	US20160141163	Pub Dt:	05/19/2016
Title:	MASS SPECTROMETRIC DEVICE AND MASS SPECTROMETRIC DEVICE CONTROL METHOD

Patent #:	9993822	Issue Dt:	06/12/2018	Application #:	14898286	Filing Dt:	12/14/2015
Publication #:	US20160144366	Pub Dt:	05/26/2016
Title:	NUCLEIC ACID AMPLIFICATION/DETECTION DEVICE AND NUCLEIC ACID INSPECTION DEVICE USING SAME

Patent #:	10139390	Issue Dt:	11/27/2018	Application #:	14898298	Filing Dt:	12/14/2015
Publication #:	US20160153960	Pub Dt:	06/02/2016
Title:	ANALYSIS DEVICE

Patent #:	9679371	Issue Dt:	06/13/2017	Application #:	14898973	Filing Dt:	12/16/2015
Publication #:	US20160189368	Pub Dt:	06/30/2016
Title:	Pattern Shape Evaluation Device and Method

Patent #:	9536703	Issue Dt:	01/03/2017	Application #:	14899795	Filing Dt:	12/18/2015
Publication #:	US20160148782	Pub Dt:	05/26/2016
Title:	Scanning Electron Microscope

Patent #:	9958468	Issue Dt:	05/01/2018	Application #:	14901370	Filing Dt:	12/28/2015
Publication #:	US20160154016	Pub Dt:	06/02/2016
Title:	AUTOMATIC ANALYZER

Patent #:	10515777	Issue Dt:	12/24/2019	Application #:	14901506	Filing Dt:	12/28/2015
Publication #:	US20160155602	Pub Dt:	06/02/2016
Title:	Ion Milling Device and Processing Method Using the Ion Milling Device

Patent #:	9741531	Issue Dt:	08/22/2017	Application #:	14905170	Filing Dt:	01/14/2016
Publication #:	US20160163504	Pub Dt:	06/09/2016
Title:	Charged Particle Beam Device Enabling Facilitated EBSD Detector Analysis of Desired Position and Control Method Thereof

Patent #:	10112195	Issue Dt:	10/30/2018	Application #:	14907844	Filing Dt:	01/27/2016
Publication #:	US20160167049	Pub Dt:	06/16/2016
Title:	FLOW CELL FOR NUCLEIC ACID ANALYSIS AND NUCLEIC ACID ANALYZER

Patent #:	9523663	Issue Dt:	12/20/2016	Application #:	14908234	Filing Dt:	01/28/2016
Publication #:	US20160169845	Pub Dt:	06/16/2016
Title:	Mass Spectrometer

Patent #:	10121686	Issue Dt:	11/06/2018	Application #:	14908452	Filing Dt:	01/28/2016
Publication #:	US20160379857	Pub Dt:	12/29/2016
Title:	VACUUM PROCESSING APPARATUS

Patent #:	9678093	Issue Dt:	06/13/2017	Application #:	14909782	Filing Dt:	02/03/2016
Publication #:	US20160161521	Pub Dt:	06/09/2016
Title:	AUTOMATIC ANALYZER

Patent #:	9885732	Issue Dt:	02/06/2018	Application #:	14911406	Filing Dt:	02/10/2016
Publication #:	US20160195561	Pub Dt:	07/07/2016
Title:	ANALYSIS DEVICE AND ANALYSIS METHOD

Patent #:	9704699	Issue Dt:	07/11/2017	Application #:	14911411	Filing Dt:	02/10/2016
Publication #:	US20160196965	Pub Dt:	07/07/2016
Title:	Hybrid Ion Source and Mass Spectrometric Device

Patent #:	9633817	Issue Dt:	04/25/2017	Application #:	14911681	Filing Dt:	02/11/2016
Publication #:	US20160203941	Pub Dt:	07/14/2016
Title:	Diaphragm Mounting Member and Charged Particle Beam Device

Patent #:	9689883	Issue Dt:	06/27/2017	Application #:	14911912	Filing Dt:	02/12/2016
Publication #:	US20160195562	Pub Dt:	07/07/2016
Title:	AUTOMATED ANALYZER

Patent #:	10269533	Issue Dt:	04/23/2019	Application #:	14911960	Filing Dt:	02/12/2016
Publication #:	US20160203940	Pub Dt:	07/14/2016
Title:	Anti-Contamination Trap, and Vacuum Application Device

Patent #:	9741526	Issue Dt:	08/22/2017	Application #:	14912521	Filing Dt:	02/17/2016
Publication #:	US20160203944	Pub Dt:	07/14/2016
Title:	Charged Particle Beam Apparatus and Sample Image Acquiring Method

Patent #:	9754763	Issue Dt:	09/05/2017	Application #:	14912549	Filing Dt:	02/17/2016
Publication #:	US20160203943	Pub Dt:	07/14/2016
Title:	ELECTRON MICROSCOPE

Patent #:	9721752	Issue Dt:	08/01/2017	Application #:	14912553	Filing Dt:	02/17/2016
Publication #:	US20160211109	Pub Dt:	07/21/2016
Title:	Sample Holder and Charged Particle Device

100

Patent #:	9857219	Issue Dt:	01/02/2018	Application #:	14913809	Filing Dt:	02/23/2016
Publication #:	US20160245690	Pub Dt:	08/25/2016
Title:	Nucleic Acid Analysis Device and Diagnosis Method

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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