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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 19 of 23
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Patent #:	10192720	Issue Dt:	01/29/2019	Application #:	15210257	Filing Dt:	07/14/2016
Publication #:	US20170018405	Pub Dt:	01/19/2017
Title:	PLASMA PROCESSING APPARATUS

Patent #:	10295339	Issue Dt:	05/21/2019	Application #:	15215756	Filing Dt:	07/21/2016
Publication #:	US20170030712	Pub Dt:	02/02/2017
Title:	Pattern Measurement Method and Measurement Apparatus

Patent #:	9947088	Issue Dt:	04/17/2018	Application #:	15215888	Filing Dt:	07/21/2016
Publication #:	US20170032212	Pub Dt:	02/02/2017
Title:	Evaluation Condition Setting Method of Semiconductor Device, and Evaluation Condition Setting Apparatus

Patent #:	10037866	Issue Dt:	07/31/2018	Application #:	15217460	Filing Dt:	07/22/2016
Publication #:	US20170025251	Pub Dt:	01/26/2017
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	10020163	Issue Dt:	07/10/2018	Application #:	15225942	Filing Dt:	08/02/2016
Publication #:	US20160343542	Pub Dt:	11/24/2016
Title:	CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OPERATION PROGRAM

Patent #:	10184948	Issue Dt:	01/22/2019	Application #:	15245237	Filing Dt:	08/24/2016
Publication #:	US20160363604	Pub Dt:	12/15/2016
Title:	AUTOMATED ANALYZER

Patent #:	10192749	Issue Dt:	01/29/2019	Application #:	15248171	Filing Dt:	08/26/2016
Publication #:	US20170162397	Pub Dt:	06/08/2017
Title:	DRY-ETCHING METHOD

Patent #:	10490412	Issue Dt:	11/26/2019	Application #:	15248205	Filing Dt:	08/26/2016
Publication #:	US20170194157	Pub Dt:	07/06/2017
Title:	METHOD FOR RELEASING SAMPLE AND PLASMA PROCESSING APPARATUS USING SAME

Patent #:	9734983	Issue Dt:	08/15/2017	Application #:	15251040	Filing Dt:	08/30/2016
Publication #:	US20170061947	Pub Dt:	03/02/2017
Title:	CHARGED PARTICLE RADIATION APPARATUS

Patent #:	10243140	Issue Dt:	03/26/2019	Application #:	15251595	Filing Dt:	08/30/2016
Publication #:	US20170194560	Pub Dt:	07/06/2017
Title:	MANUFACTURING METHOD OF MAGNETORESISTIVE ELEMENT AND VACUUM PROCESSING APPARATUS

Patent #:	9972776	Issue Dt:	05/15/2018	Application #:	15260351	Filing Dt:	09/09/2016
Publication #:	US20170194561	Pub Dt:	07/06/2017
Title:	PLASMA PROCESSING METHOD

Patent #:	11417501	Issue Dt:	08/16/2022	Application #:	15260512	Filing Dt:	09/09/2016
Publication #:	US20170092468	Pub Dt:	03/30/2017
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10346733	Issue Dt:	07/09/2019	Application #:	15267209	Filing Dt:	09/16/2016
Publication #:	US20170004394	Pub Dt:	01/05/2017
Title:	ORIENTATION IDENTIFICATION LABEL, REAGENT CONTAINER CARRIER STRUCTURE, ANALYZER DEVICE AND READER MODULE

Patent #:	10438771	Issue Dt:	10/08/2019	Application #:	15273523	Filing Dt:	09/22/2016
Publication #:	US20170092462	Pub Dt:	03/30/2017
Title:	MEASUREMENT DEVICE, CALIBRATION METHOD OF MEASUREMENT DEVICE, AND CALIBRATION MEMBER

Patent #:	10217613	Issue Dt:	02/26/2019	Application #:	15273812	Filing Dt:	09/23/2016
Publication #:	US20170186587	Pub Dt:	06/29/2017
Title:	PLASMA PROCESSING APPARATUS

Patent #:	10151766	Issue Dt:	12/11/2018	Application #:	15275679	Filing Dt:	09/26/2016
Publication #:	US20170010292	Pub Dt:	01/12/2017
Title:	AUTOMATIC ANALYZER

Patent #:	9934946	Issue Dt:	04/03/2018	Application #:	15277272	Filing Dt:	09/27/2016
Publication #:	US20170178874	Pub Dt:	06/22/2017
Title:	PLASMA PROCESSING APPARATUS AND OPERATING METHOD OF PLASMA PROCESSING APPARATUS

Patent #:	10255519	Issue Dt:	04/09/2019	Application #:	15292218	Filing Dt:	10/13/2016
Publication #:	US20170109607	Pub Dt:	04/20/2017
Title:	Inspection Apparatus and Method Using Pattern Matching

Patent #:	9892887	Issue Dt:	02/13/2018	Application #:	15292832	Filing Dt:	10/13/2016
Publication #:	US20170110285	Pub Dt:	04/20/2017
Title:	Charged Particle Beam Apparatus

Patent #:	9960031	Issue Dt:	05/01/2018	Application #:	15293480	Filing Dt:	10/14/2016
Publication #:	US20170032955	Pub Dt:	02/02/2017
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	9976966	Issue Dt:	05/22/2018	Application #:	15299662	Filing Dt:	10/21/2016
Publication #:	US20170102338	Pub Dt:	04/13/2017
Title:	DEFECT INSPECTION METHOD AND ITS DEVICE

Patent #:	9966218	Issue Dt:	05/08/2018	Application #:	15303282	Filing Dt:	10/11/2016
Publication #:	US20170040139	Pub Dt:	02/09/2017
Title:	Electron Beam Device

Patent #:	10014160	Issue Dt:	07/03/2018	Application #:	15304869	Filing Dt:	10/18/2016
Publication #:	US20170186583	Pub Dt:	06/29/2017
Title:	SCANNING ELECTRON MICROSCOPE AND METHOD FOR CONTROLLING SAME

Patent #:	9971139	Issue Dt:	05/15/2018	Application #:	15305226	Filing Dt:	10/19/2016
Publication #:	US20170045726	Pub Dt:	02/16/2017
Title:	Microscope Observation Container and Observation Device

Patent #:	10002743	Issue Dt:	06/19/2018	Application #:	15305740	Filing Dt:	10/21/2016
Publication #:	US20170047197	Pub Dt:	02/16/2017
Title:	MEASUREMENT SYSTEM AND MEASUREMENT METHOD

Patent #:	9761412	Issue Dt:	09/12/2017	Application #:	15306510	Filing Dt:	10/25/2016
Publication #:	US20170047198	Pub Dt:	02/16/2017
Title:	Ion Milling Apparatus and Sample Processing Method

Patent #:	9799483	Issue Dt:	10/24/2017	Application #:	15306977	Filing Dt:	10/26/2016
Publication #:	US20170053777	Pub Dt:	02/23/2017
Title:	CHARGED PARTICLE BEAM DEVICE AND DETECTION METHOD USING SAID DEVICE

Patent #:	9922798	Issue Dt:	03/20/2018	Application #:	15307206	Filing Dt:	10/27/2016
Publication #:	US20170047196	Pub Dt:	02/16/2017
Title:	SAMPLE PROCESSING METHOD AND CHARGED PARTICLE BEAM DEVICE

Patent #:	10451643	Issue Dt:	10/22/2019	Application #:	15308914	Filing Dt:	11/04/2016
Publication #:	US20170059600	Pub Dt:	03/02/2017
Title:	SAMPLE DISPENSING DEVICE AND NOZZLE TIP FOR SAMPLE DISPENSING DEVICE

Patent #:	9960006	Issue Dt:	05/01/2018	Application #:	15310438	Filing Dt:	11/10/2016
Publication #:	US20170092459	Pub Dt:	03/30/2017
Title:	CHARGED-PARTICLE-BEAM DEVICE

Patent #:	10288637	Issue Dt:	05/14/2019	Application #:	15310808	Filing Dt:	11/14/2016
Publication #:	US20170089938	Pub Dt:	03/30/2017
Title:	AUTOMATIC ANALYZER

Patent #:	9823228	Issue Dt:	11/21/2017	Application #:	15312792	Filing Dt:	11/21/2016
Publication #:	US20170097328	Pub Dt:	04/06/2017
Title:	CHROMATOGRAPH MASS SPECTROMETER AND CONTROL METHOD THEREFOR

Patent #:	9824853	Issue Dt:	11/21/2017	Application #:	15312866	Filing Dt:	11/21/2016
Publication #:	US20170169992	Pub Dt:	06/15/2017
Title:	ELECTRON MICROSCOPE DEVICE AND IMAGING METHOD USING SAME

Patent #:	10234472	Issue Dt:	03/19/2019	Application #:	15313981	Filing Dt:	11/25/2016
Publication #:	US20170212137	Pub Dt:	07/27/2017
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	10012663	Issue Dt:	07/03/2018	Application #:	15313992	Filing Dt:	11/25/2016
Publication #:	US20170205435	Pub Dt:	07/20/2017
Title:	AUTOMATIC ANALYZER

Patent #:	10401300	Issue Dt:	09/03/2019	Application #:	15317065	Filing Dt:	12/07/2016
Publication #:	US20170108444	Pub Dt:	04/20/2017
Title:	DEFECT OBSERVATION METHOD AND DEVICE AND DEFECT DETECTION DEVICE

Patent #:	10008361	Issue Dt:	06/26/2018	Application #:	15318455	Filing Dt:	12/13/2016
Publication #:	US20170169988	Pub Dt:	06/15/2017
Title:	CHARGED PARTICLE BEAM DEVICE AND INSTALLATION METHOD

Patent #:	10068756	Issue Dt:	09/04/2018	Application #:	15318858	Filing Dt:	12/14/2016
Publication #:	US20170125230	Pub Dt:	05/04/2017
Title:	MASS SPECTROMETER

Patent #:	10073111	Issue Dt:	09/11/2018	Application #:	15319416	Filing Dt:	12/16/2016
Publication #:	US20170153259	Pub Dt:	06/01/2017
Title:	Automatic Analysis Device

Patent #:	10732192	Issue Dt:	08/04/2020	Application #:	15319914	Filing Dt:	12/19/2016
Publication #:	US20170153261	Pub Dt:	06/01/2017
Title:	AUTOMATIC ANALYZER

Patent #:	10537893	Issue Dt:	01/21/2020	Application #:	15320019	Filing Dt:	12/19/2016
Publication #:	US20170151570	Pub Dt:	06/01/2017
Title:	AUTOMATIC ANALYSIS APPARATUS

Patent #:	10761000	Issue Dt:	09/01/2020	Application #:	15320769	Filing Dt:	12/21/2016
Publication #:	US20170205321	Pub Dt:	07/20/2017
Title:	LIQUID STIRRING METHOD

Patent #:	10190875	Issue Dt:	01/29/2019	Application #:	15321667	Filing Dt:	12/22/2016
Publication #:	US20170160082	Pub Dt:	06/08/2017
Title:	PATTERN MEASUREMENT CONDITION SETTING DEVICE AND PATTERN MEASURING DEVICE

Patent #:	10184790	Issue Dt:	01/22/2019	Application #:	15322338	Filing Dt:	12/27/2016
Publication #:	US20170138725	Pub Dt:	05/18/2017
Title:	PATTERN MEASUREMENT METHOD AND PATTERN MEASUREMENT DEVICE

Patent #:	9754762	Issue Dt:	09/05/2017	Application #:	15322659	Filing Dt:	12/28/2016
Publication #:	US20170133195	Pub Dt:	05/11/2017
Title:	ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

Patent #:	9892901	Issue Dt:	02/13/2018	Application #:	15324092	Filing Dt:	01/05/2017
Publication #:	US20170162375	Pub Dt:	06/08/2017
Title:	MASS SPECTROMETRY DEVICE

Patent #:	10217602	Issue Dt:	02/26/2019	Application #:	15324124	Filing Dt:	01/05/2017
Publication #:	US20170162362	Pub Dt:	06/08/2017
Title:	CHARGED PARTICLE BEAM APPARATUS AND ABERRATION CORRECTOR

Patent #:	9921160	Issue Dt:	03/20/2018	Application #:	15324149	Filing Dt:	01/05/2017
Publication #:	US20170212052	Pub Dt:	07/27/2017
Title:	MULTICHANNEL ANALYSIS DEVICE

Patent #:	10191074	Issue Dt:	01/29/2019	Application #:	15324289	Filing Dt:	01/06/2017
Publication #:	US20170227563	Pub Dt:	08/10/2017
Title:	AUTOMATIC ANALYZING APPARATUS

Patent #:	10761105	Issue Dt:	09/01/2020	Application #:	15325519	Filing Dt:	01/11/2017
Publication #:	US20170176484	Pub Dt:	06/22/2017
Title:	AUTOMATIC ANALYZING APPARATUS

Patent #:	10267816	Issue Dt:	04/23/2019	Application #:	15326769	Filing Dt:	01/17/2017
Publication #:	US20170205436	Pub Dt:	07/20/2017
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	10267817	Issue Dt:	04/23/2019	Application #:	15326820	Filing Dt:	01/17/2017
Publication #:	US20170212138	Pub Dt:	07/27/2017
Title:	Automatic Analysis Apparatus

Patent #:	10138456	Issue Dt:	11/27/2018	Application #:	15327208	Filing Dt:	01/18/2017
Publication #:	US20170159003	Pub Dt:	06/08/2017
Title:	CELL CONCENTRATION ADJUSTMENT DEVICE, AND AUTOMATIC SUBCULTURE SYSTEM USING SAME

Patent #:	10604393	Issue Dt:	03/31/2020	Application #:	15327484	Filing Dt:	01/19/2017
Publication #:	US20170166428	Pub Dt:	06/15/2017
Title:	PARTICLE SUCTION CAPTURE MECHANISM AND UNSTOPPING DEVICE EQUIPPED WITH PARTICLE SUCTION CAPTURE MECHANISM

Patent #:	10145858	Issue Dt:	12/04/2018	Application #:	15328104	Filing Dt:	01/23/2017
Publication #:	US20170219617	Pub Dt:	08/03/2017
Title:	AUTOMATIC ANALYZING APPARATUS

Patent #:	10297021	Issue Dt:	05/21/2019	Application #:	15329480	Filing Dt:	01/26/2017
Publication #:	US20170323435	Pub Dt:	11/09/2017
Title:	DEFECT QUANTIFICATION METHOD, DEFECT QUANTIFICATION DEVICE, AND DEFECT EVALUATION VALUE DISPLAY DEVICE

Patent #:	10393509	Issue Dt:	08/27/2019	Application #:	15329504	Filing Dt:	01/26/2017
Publication #:	US20170211929	Pub Dt:	07/27/2017
Title:	Pattern Height Measurement Device and Charged Particle Beam Device

Patent #:	10094658	Issue Dt:	10/09/2018	Application #:	15329519	Filing Dt:	01/26/2017
Publication #:	US20170322021	Pub Dt:	11/09/2017
Title:	OVERLAY MEASUREMENT METHOD, DEVICE, AND DISPLAY DEVICE

Patent #:	10522331	Issue Dt:	12/31/2019	Application #:	15333669	Filing Dt:	10/25/2016
Publication #:	US20170040143	Pub Dt:	02/09/2017
Title:	PLASMA PROCESSING APPARATUS

Patent #:	9859094	Issue Dt:	01/02/2018	Application #:	15365545	Filing Dt:	11/30/2016
Publication #:	US20170207061	Pub Dt:	07/20/2017
Title:	CHARGED PARTICLE BEAM APPARATUS AND IMAGE FORMING METHOD OF CHARGED PARTICLE BEAM APPARATUS

Patent #:	9960014	Issue Dt:	05/01/2018	Application #:	15370486	Filing Dt:	12/06/2016
Publication #:	US20170084430	Pub Dt:	03/23/2017
Title:	PLASMA ETCHING METHOD

Patent #:	9645094	Issue Dt:	05/09/2017	Application #:	15387786	Filing Dt:	12/22/2016
Publication #:	US20170102339	Pub Dt:	04/13/2017
Title:	DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

Patent #:	10262835	Issue Dt:	04/16/2019	Application #:	15392060	Filing Dt:	12/28/2016
Publication #:	US20170110289	Pub Dt:	04/20/2017
Title:	PLASMA PROCESSING EQUIPMENT AND PLASMA GENERATION EQUIPMENT

Patent #:	10261026	Issue Dt:	04/16/2019	Application #:	15398911	Filing Dt:	01/05/2017
Publication #:	US20170115231	Pub Dt:	04/27/2017
Title:	DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD, AND LOW LIGHT DETECTOR

Patent #:	10020160	Issue Dt:	07/10/2018	Application #:	15417887	Filing Dt:	01/27/2017
Publication #:	US20170221672	Pub Dt:	08/03/2017
Title:	Charged Particle Beam Device

Patent #:	11355322	Issue Dt:	06/07/2022	Application #:	15425014	Filing Dt:	02/06/2017
Publication #:	US20180040459	Pub Dt:	02/08/2018
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10825700	Issue Dt:	11/03/2020	Application #:	15425155	Filing Dt:	02/06/2017
Publication #:	US20180040491	Pub Dt:	02/08/2018
Title:	PLASMA PROCESSING APPARATUS AND METHOD FOR RELEASING SAMPLE

Patent #:	9899241	Issue Dt:	02/20/2018	Application #:	15434562	Filing Dt:	02/16/2017
Publication #:	US20170243765	Pub Dt:	08/24/2017
Title:	PLASMA PROCESSING METHOD

Patent #:	10153217	Issue Dt:	12/11/2018	Application #:	15437026	Filing Dt:	02/20/2017
Publication #:	US20180068909	Pub Dt:	03/08/2018
Title:	PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD

Patent #:	10056226	Issue Dt:	08/21/2018	Application #:	15440327	Filing Dt:	02/23/2017
Publication #:	US20170250054	Pub Dt:	08/31/2017
Title:	CHARGED PARTICLE BEAM APPARATUS AND VIBRATION DAMPER FOR CHARGED PARTICLE BEAM APPARATUS

Patent #:	10056236	Issue Dt:	08/21/2018	Application #:	15443488	Filing Dt:	02/27/2017
Publication #:	US20180082825	Pub Dt:	03/22/2018
Title:	PLASMA PROCESSING METHOD

Patent #:	10186399	Issue Dt:	01/22/2019	Application #:	15445055	Filing Dt:	02/28/2017
Publication #:	US20170301513	Pub Dt:	10/19/2017
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	10495658	Issue Dt:	12/03/2019	Application #:	15467303	Filing Dt:	03/23/2017
Publication #:	US20170192027	Pub Dt:	07/06/2017
Title:	AUTOMATIC ANALYZER

Patent #:	10141207	Issue Dt:	11/27/2018	Application #:	15468259	Filing Dt:	03/24/2017
Publication #:	US20180090345	Pub Dt:	03/29/2018
Title:	OPERATION METHOD OF PLASMA PROCESSING APPARATUS

Patent #:	10121632	Issue Dt:	11/06/2018	Application #:	15487561	Filing Dt:	04/14/2017
Publication #:	US20170316915	Pub Dt:	11/02/2017
Title:	Charged Particle Beam Apparatus

Patent #:	10332722	Issue Dt:	06/25/2019	Application #:	15500392	Filing Dt:	01/30/2017
Publication #:	US20170221677	Pub Dt:	08/03/2017
Title:	ION MILLING DEVICE AND ION MILLING METHOD

Patent #:	10304653	Issue Dt:	05/28/2019	Application #:	15500449	Filing Dt:	01/30/2017
Publication #:	US20170221671	Pub Dt:	08/03/2017
Title:	ION MILLING DEVICE, ION SOURCE AND ION MILLING METHOD

Patent #:	10211022	Issue Dt:	02/19/2019	Application #:	15501584	Filing Dt:	02/03/2017
Publication #:	US20170229277	Pub Dt:	08/10/2017
Title:	ION BEAM APPARATUS AND ION BEAM IRRADIATION METHOD

Patent #:	10297416	Issue Dt:	05/21/2019	Application #:	15513695	Filing Dt:	03/23/2017
Publication #:	US20170309437	Pub Dt:	10/26/2017
Title:	Scanning Electron Microscope

Patent #:	10204761	Issue Dt:	02/12/2019	Application #:	15514539	Filing Dt:	03/27/2017
Publication #:	US20170221676	Pub Dt:	08/03/2017
Title:	Charged Particle Beam Device, Electron Microscope and Sample Observation Method

Patent #:	10366858	Issue Dt:	07/30/2019	Application #:	15514735	Filing Dt:	07/18/2017
Publication #:	US20170352517	Pub Dt:	12/07/2017
Title:	Ion Beam Device

Patent #:	10466261	Issue Dt:	11/05/2019	Application #:	15517630	Filing Dt:	04/07/2017
Publication #:	US20170328925	Pub Dt:	11/16/2017
Title:	AUTOMATIC ANALYSIS DEVICE

Patent #:	10456767	Issue Dt:	10/29/2019	Application #:	15518041	Filing Dt:	04/10/2017
Publication #:	US20170306287	Pub Dt:	10/26/2017
Title:	CYTOMETRIC MECHANISM, CELL CULTURE DEVICE COMPRISING SAME, AND CYTOMETRIC METHOD

Patent #:	10031083	Issue Dt:	07/24/2018	Application #:	15518341	Filing Dt:	04/11/2017
Publication #:	US20170307532	Pub Dt:	10/26/2017
Title:	FIXED POSITION CONTROLLER AND METHOD

Patent #:	10453648	Issue Dt:	10/22/2019	Application #:	15520953	Filing Dt:	04/21/2017
Publication #:	US20170345614	Pub Dt:	11/30/2017
Title:	Charged Particle Beam Device and Information-Processing Device

Patent #:	NONE	Issue Dt:		Application #:	15521348	Filing Dt:	04/24/2017
Publication #:	US20190153377	Pub Dt:	05/23/2019
Title:	STERILE CONNECTOR AND CELL CULTURE DEVICE PROVIDED THEREWITH

Patent #:	10304656	Issue Dt:	05/28/2019	Application #:	15526644	Filing Dt:	05/12/2017
Publication #:	US20170323764	Pub Dt:	11/09/2017
Title:	ION BEAM DEVICE

Patent #:	10217604	Issue Dt:	02/26/2019	Application #:	15527073	Filing Dt:	05/16/2017
Publication #:	US20180286629	Pub Dt:	10/04/2018
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	10134564	Issue Dt:	11/20/2018	Application #:	15527562	Filing Dt:	05/17/2017
Publication #:	US20170330724	Pub Dt:	11/16/2017
Title:	CHARGED PARTICLE BEAM DEVICE

Patent #:	10444011	Issue Dt:	10/15/2019	Application #:	15528692	Filing Dt:	05/22/2017
Publication #:	US20170268870	Pub Dt:	09/21/2017
Title:	Sample for Coordinates Calibration and Method for Fabricating the Same

Patent #:	11130985	Issue Dt:	09/28/2021	Application #:	15529122	Filing Dt:	05/24/2017
Publication #:	US20170260573	Pub Dt:	09/14/2017
Title:	SPOT ARRAY SUBSTRATE, METHOD FOR PRODUCING SAME, AND NUCLEIC ACID POLYMER ANALYSIS METHOD AND DEVICE

Patent #:	10352879	Issue Dt:	07/16/2019	Application #:	15529874	Filing Dt:	05/25/2017
Publication #:	US20170261441	Pub Dt:	09/14/2017
Title:	X-RAY INSPECTION METHOD AND DEVICE

Patent #:	9964500	Issue Dt:	05/08/2018	Application #:	15531066	Filing Dt:	05/26/2017
Publication #:	US20170328846	Pub Dt:	11/16/2017
Title:	Defect Inspection Device, Display Device, and Defect Classification Device

Patent #:	10294525	Issue Dt:	05/21/2019	Application #:	15531500	Filing Dt:	05/30/2017
Publication #:	US20170268054	Pub Dt:	09/21/2017
Title:	BIOMOLECULE MEASUREMENT SYSTEM AND BIOMOLECULE MEASUREMENT METHOD

Patent #:	10711294	Issue Dt:	07/14/2020	Application #:	15533087	Filing Dt:	06/05/2017
Publication #:	US20170362634	Pub Dt:	12/21/2017
Title:	NUCLEIC ACID ANALYSIS DEVICE

Patent #:	10168286	Issue Dt:	01/01/2019	Application #:	15533424	Filing Dt:	06/06/2017
Publication #:	US20180266968	Pub Dt:	09/20/2018
Title:	DEFECT OBSERVATION DEVICE AND DEFECT OBSERVATION METHOD

Patent #:	10101150	Issue Dt:	10/16/2018	Application #:	15533489	Filing Dt:	06/06/2017
Publication #:	US20170343340	Pub Dt:	11/30/2017
Title:	Height Measurement Device and Charged Particle Beam Device

Patent #:	10541103	Issue Dt:	01/21/2020	Application #:	15533517	Filing Dt:	06/06/2017
Publication #:	US20170345613	Pub Dt:	11/30/2017
Title:	Charged Particle Beam Device

Patent #:	10249471	Issue Dt:	04/02/2019	Application #:	15534219	Filing Dt:	06/08/2017
Publication #:	US20170330722	Pub Dt:	11/16/2017
Title:	COMPOSITE CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

100

Patent #:	10139369	Issue Dt:	11/27/2018	Application #:	15534607	Filing Dt:	06/09/2017
Publication #:	US20170336357	Pub Dt:	11/23/2017
Title:	MASS SPECTROMETER

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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