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Reel/Frame:	052259/0227			Pages:	68
		Recorded:	03/30/2020
Attorney Dkt #:	T&A-GENERAL/Z-1830(USMA)
Conveyance:	CHANGE OF NAME AND ADDRESS

Total properties: 2251
Page 5 of 23
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Patent #:	7925076	Issue Dt:	04/12/2011	Application #:	11836452	Filing Dt:	08/09/2007
Publication #:	US20080069453	Pub Dt:	03/20/2008
Title:	INSPECTION APPARATUS USING TEMPLATE MATCHING METHOD USING SIMILARITY DISTRIBUTION

Patent #:	8580196	Issue Dt:	11/12/2013	Application #:	11840042	Filing Dt:	08/16/2007
Publication #:	US20080056939	Pub Dt:	03/06/2008
Title:	AUTOMATIC ANALYZER

Patent #:	NONE	Issue Dt:		Application #:	11840689	Filing Dt:	08/17/2007
Publication #:	US20080056942	Pub Dt:	03/06/2008
Title:	AUTOMATIC ANALYZER

Patent #:	7408172	Issue Dt:	08/05/2008	Application #:	11841411	Filing Dt:	08/20/2007
Publication #:	US20080042074	Pub Dt:	02/21/2008
Title:	CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM IRRADIATION METHOD

Patent #:	7750296	Issue Dt:	07/06/2010	Application #:	11866426	Filing Dt:	10/03/2007
Publication #:	US20080210867	Pub Dt:	09/04/2008
Title:	SCANNING ELECTRON MICROSCOPE AND CALIBRATION OF IMAGE DISTORTION

Patent #:	7723681	Issue Dt:	05/25/2010	Application #:	11871687	Filing Dt:	10/12/2007
Publication #:	US20080265160	Pub Dt:	10/30/2008
Title:	OBSERVATION METHOD WITH ELECTRON BEAM

Patent #:	7875849	Issue Dt:	01/25/2011	Application #:	11877715	Filing Dt:	10/24/2007
Publication #:	US20080099673	Pub Dt:	05/01/2008
Title:	ELECTRON BEAM APPARATUS AND ELECTRON BEAM INSPECTION METHOD

Patent #:	7811451	Issue Dt:	10/12/2010	Application #:	11877944	Filing Dt:	10/24/2007
Publication #:	US20080099389	Pub Dt:	05/01/2008
Title:	SEPARATION COLUMN AND LIQUID CHROMATOGRAPH USING THE SAME

Patent #:	7791721	Issue Dt:	09/07/2010	Application #:	11878197	Filing Dt:	07/23/2007
Publication #:	US20080027665	Pub Dt:	01/31/2008
Title:	SURFACE INSPECTION WITH VARIABLE DIGITAL FILTERNING

Patent #:	7829845	Issue Dt:	11/09/2010	Application #:	11878241	Filing Dt:	07/23/2007
Publication #:	US20080048110	Pub Dt:	02/28/2008
Title:	METHODS AND INSTRUMENTS FOR IDENTIFICATION OF GLYCOSYLATED PROTEINS AND PEPTIDES

Patent #:	7504627	Issue Dt:	03/17/2009	Application #:	11878361	Filing Dt:	07/24/2007
Publication #:	US20070272860	Pub Dt:	11/29/2007
Title:	ELECTRON BEAM INSPECTION APPARATUS

Patent #:	7925390	Issue Dt:	04/12/2011	Application #:	11882063	Filing Dt:	07/30/2007
Publication #:	US20080046133	Pub Dt:	02/21/2008
Title:	MINI ENVIRONMENT APPARATUS, INSPECTION APPARATUS, MANUFACTURING APPARATUS AND CLEANING METHOD OF SPACE

Patent #:	7557347	Issue Dt:	07/07/2009	Application #:	11882701	Filing Dt:	08/03/2007
Publication #:	US20080121803	Pub Dt:	05/29/2008
Title:	CHARGED PARTICLE BEAM APPARATUS, SCANNING ELECTRON MICROSCOPE, AND SAMPLE OBSERVATION METHOD USING THE SAME

Patent #:	7640117	Issue Dt:	12/29/2009	Application #:	11889056	Filing Dt:	08/08/2007
Publication #:	US20080059079	Pub Dt:	03/06/2008
Title:	CHROMATOGRAPH ANALYZING DEVICE FOR PROCESSING A WAVEFORM OF CHROMATOGRAPH DATA

Patent #:	7935925	Issue Dt:	05/03/2011	Application #:	11889057	Filing Dt:	08/08/2007
Publication #:	US20080073528	Pub Dt:	03/27/2008
Title:	CHARGED PARTICLE BEAM SCANNING METHOD AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	7989764	Issue Dt:	08/02/2011	Application #:	11889232	Filing Dt:	08/10/2007
Publication #:	US20080054173	Pub Dt:	03/06/2008
Title:	ION TRAP MASS SPECTROMETRY METHOD

Patent #:	7755035	Issue Dt:	07/13/2010	Application #:	11889264	Filing Dt:	08/10/2007
Publication #:	US20080245962	Pub Dt:	10/09/2008
Title:	ION TRAP TIME-OF-FLIGHT MASS SPECTROMETER

Patent #:	7598497	Issue Dt:	10/06/2009	Application #:	11892332	Filing Dt:	08/22/2007
Publication #:	US20080054187	Pub Dt:	03/06/2008
Title:	CHARGED PARTICLE BEAM SCANNING METHOD AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	7584012	Issue Dt:	09/01/2009	Application #:	11892583	Filing Dt:	08/24/2007
Publication #:	US20080004742	Pub Dt:	01/03/2008
Title:	AUTOMATIC DEFECT REVIEW AND CLASSIFICATION SYSTEM

Patent #:	7679055	Issue Dt:	03/16/2010	Application #:	11892675	Filing Dt:	08/24/2007
Publication #:	US20080224035	Pub Dt:	09/18/2008
Title:	PATTERN DISPLACEMENT MEASURING METHOD AND PATTERN MEASURING DEVICE

Patent #:	7910886	Issue Dt:	03/22/2011	Application #:	11902088	Filing Dt:	09/19/2007
Publication #:	US20080179517	Pub Dt:	07/31/2008
Title:	SAMPLE DIMENSION MEASURING METHOD AND SCANNING ELECTRON MICROSCOPE

Patent #:	7420168	Issue Dt:	09/02/2008	Application #:	11902559	Filing Dt:	09/24/2007
Publication #:	US20080023627	Pub Dt:	01/31/2008
Title:	SCANNING ELECTRON MICROSCOPE AND CD MEASUREMENT CALIBRATION STANDARD SPECIMEN

Patent #:	7566892	Issue Dt:	07/28/2009	Application #:	11907375	Filing Dt:	10/11/2007
Publication #:	US20080048118	Pub Dt:	02/28/2008
Title:	ELECTRON BEAM APPARATUS AND METHOD FOR PRODUCTION OF ITS SPECIMEN CHAMBER

Patent #:	7763852	Issue Dt:	07/27/2010	Application #:	11936377	Filing Dt:	11/07/2007
Publication #:	US20080116375	Pub Dt:	05/22/2008
Title:	SCANNING ELECTRON MICROSCOPE HAVING TIME CONSTANT MEASUREMENT CAPABILITY

Patent #:	7612334	Issue Dt:	11/03/2009	Application #:	11939596	Filing Dt:	11/14/2007
Publication #:	US20080121791	Pub Dt:	05/29/2008
Title:	STANDARD REFERENCE COMPONENT FOR CALIBRATION, FABRICATION METHOD FOR THE SAME, AND SCANNING ELECTRON MICROSCOPE USING THE SAME

Patent #:	7719673	Issue Dt:	05/18/2010	Application #:	11940483	Filing Dt:	11/15/2007
Publication #:	US20080151235	Pub Dt:	06/26/2008
Title:	DEFECT INSPECTING DEVICE FOR SAMPLE SURFACE AND DEFECT DETECTION METHOD THEREFOR

Patent #:	7947964	Issue Dt:	05/24/2011	Application #:	11943241	Filing Dt:	11/20/2007
Publication #:	US20080116391	Pub Dt:	05/22/2008
Title:	CHARGED PARTICLE BEAM ORBIT CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	8073242	Issue Dt:	12/06/2011	Application #:	11954410	Filing Dt:	12/12/2007
Publication #:	US20080159609	Pub Dt:	07/03/2008
Title:	SEM SYSTEM AND A METHOD FOR PRODUCING A RECIPE

Patent #:	8263934	Issue Dt:	09/11/2012	Application #:	11958625	Filing Dt:	12/18/2007
Publication #:	US20090272899	Pub Dt:	11/05/2009
Title:	METHOD FOR DETECTING INFORMATION OF AN ELECTRIC POTENTIAL ON A SAMPLE AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	7880143	Issue Dt:	02/01/2011	Application #:	11958717	Filing Dt:	12/18/2007
Publication #:	US20100133433	Pub Dt:	06/03/2010
Title:	ELECTRON BEAM APPARATUS

Patent #:	7823469	Issue Dt:	11/02/2010	Application #:	11964951	Filing Dt:	12/27/2007
Publication #:	US20080156118	Pub Dt:	07/03/2008
Title:	SAMPLE DISPENSING APPARATUS

Patent #:	8008045	Issue Dt:	08/30/2011	Application #:	11976232	Filing Dt:	10/23/2007
Publication #:	US20090191539	Pub Dt:	07/30/2009
Title:	PRIMERS FOR ISOTHERMAL AMPLIFICATION OF HEPATITIS C VIRUS

Patent #:	7553334	Issue Dt:	06/30/2009	Application #:	11976238	Filing Dt:	10/23/2007
Publication #:	US20080048699	Pub Dt:	02/28/2008
Title:	DEFECTIVE PRODUCT INSPECTION APPARATUS, PROBE POSITIONING METHOD AND PROBE MOVING METHOD

Patent #:	7884322	Issue Dt:	02/08/2011	Application #:	11976968	Filing Dt:	10/30/2007
Publication #:	US20080099676	Pub Dt:	05/01/2008
Title:	SCANNING ELECTRON MICROSCOPE AND A METHOD FOR PATTERN COMPOSITE INSPECTION USING THE SAME

Patent #:	7589320	Issue Dt:	09/15/2009	Application #:	11979219	Filing Dt:	10/31/2007
Publication #:	US20080078930	Pub Dt:	04/03/2008
Title:	MASS SPECTROMETER

Patent #:	7943027	Issue Dt:	05/17/2011	Application #:	11979570	Filing Dt:	11/06/2007
Publication #:	US20080110756	Pub Dt:	05/15/2008
Title:	ELECTROPHORESIS UNIT AND ELECTROPHORETIC ANALYSIS METHOD

Patent #:	7800058	Issue Dt:	09/21/2010	Application #:	11979811	Filing Dt:	11/08/2007
Publication #:	US20080121795	Pub Dt:	05/29/2008
Title:	MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

Patent #:	7732765	Issue Dt:	06/08/2010	Application #:	11984319	Filing Dt:	11/15/2007
Publication #:	US20080128617	Pub Dt:	06/05/2008
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	8123925	Issue Dt:	02/28/2012	Application #:	11984719	Filing Dt:	11/21/2007
Publication #:	US20080116073	Pub Dt:	05/22/2008
Title:	ELECTROPHORETIC APPARATUS

Patent #:	7831394	Issue Dt:	11/09/2010	Application #:	12003012	Filing Dt:	12/19/2007
Publication #:	US20080154516	Pub Dt:	06/26/2008
Title:	INFORMATION PROCESSING SYSTEM USING NUCLEOTIDE SEQUENCE-RELATED INFORMATION

Patent #:	7696496	Issue Dt:	04/13/2010	Application #:	12003207	Filing Dt:	12/20/2007
Publication #:	US20080283778	Pub Dt:	11/20/2008
Title:	APPARATUS FOR ION BEAM FABRICATION

Patent #:	8019164	Issue Dt:	09/13/2011	Application #:	12010763	Filing Dt:	01/29/2008
Publication #:	US20080205769	Pub Dt:	08/28/2008
Title:	APPARATUS, METHOD AND PROGRAM PRODUCT FOR MATCHING WITH A TEMPLATE

Patent #:	7683313	Issue Dt:	03/23/2010	Application #:	12010852	Filing Dt:	01/30/2008
Publication #:	US20080203285	Pub Dt:	08/28/2008
Title:	CHARGED PARTICLE BEAM MEASUREMENT EQUIPMENT, SIZE CORRECTION AND STANDARD SAMPLE FOR CORRECTION

Patent #:	8497213	Issue Dt:	07/30/2013	Application #:	12013537	Filing Dt:	01/14/2008
Publication #:	US20080182419	Pub Dt:	07/31/2008
Title:	PLASMA PROCESSING METHOD

Patent #:	8106357	Issue Dt:	01/31/2012	Application #:	12016290	Filing Dt:	01/18/2008
Publication #:	US20080251719	Pub Dt:	10/16/2008
Title:	SCANNING ELECTRON MICROSCOPE AND METHOD FOR PROCESSING AN IMAGE OBTAINED BY THE SCANNING ELECTRON MICROSCOPE

Patent #:	8906196	Issue Dt:	12/09/2014	Application #:	12019150	Filing Dt:	01/24/2008
Publication #:	US20080251206	Pub Dt:	10/16/2008
Title:	Plasma Processing Apparatus And Method For Controlling The Same

Patent #:	8000939	Issue Dt:	08/16/2011	Application #:	12021619	Filing Dt:	01/29/2008
Publication #:	US20080215260	Pub Dt:	09/04/2008
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	7705302	Issue Dt:	04/27/2010	Application #:	12021810	Filing Dt:	01/29/2008
Publication #:	US20080191135	Pub Dt:	08/14/2008
Title:	SCANNING ELECTRON MICROSCOPE

Patent #:	8506834	Issue Dt:	08/13/2013	Application #:	12022207	Filing Dt:	01/30/2008
Publication #:	US20090078676	Pub Dt:	03/26/2009
Title:	METHOD FOR DRY ETCHING AL2O3 FILM

Patent #:	8095896	Issue Dt:	01/10/2012	Application #:	12031782	Filing Dt:	02/15/2008
Publication #:	US20080204405	Pub Dt:	08/28/2008
Title:	METHOD AND SYSTEM OF DISPLAYING AN EXPOSURE CONDITION

Patent #:	8765474	Issue Dt:	07/01/2014	Application #:	12032339	Filing Dt:	02/15/2008
Publication #:	US20080213903	Pub Dt:	09/04/2008
Title:	AUTOMATIC ANALYZER AND THE ANALYZING METHOD USING THE SAME

Patent #:	8048374	Issue Dt:	11/01/2011	Application #:	12032353	Filing Dt:	02/15/2008
Publication #:	US20080199358	Pub Dt:	08/21/2008
Title:	AUTOMATIC ANALYZER

Patent #:	7626163	Issue Dt:	12/01/2009	Application #:	12033470	Filing Dt:	02/19/2008
Publication #:	US20080290274	Pub Dt:	11/27/2008
Title:	DEFECT REVIEW METHOD AND DEVICE FOR SEMICONDUCTOR DEVICE

Patent #:	7633061	Issue Dt:	12/15/2009	Application #:	12034696	Filing Dt:	02/21/2008
Publication #:	US20080197280	Pub Dt:	08/21/2008
Title:	METHOD AND APPARATUS FOR MEASURING PATTERN DIMENSIONS

Patent #:	7976632	Issue Dt:	07/12/2011	Application #:	12034837	Filing Dt:	02/21/2008
Publication #:	US20080145193	Pub Dt:	06/19/2008
Title:	VACUUM PROCESSING APPARATUS

Patent #:	8029874	Issue Dt:	10/04/2011	Application #:	12035759	Filing Dt:	02/22/2008
Publication #:	US20090183683	Pub Dt:	07/23/2009
Title:	PLASMA PROCESSING APPARATUS AND METHOD FOR VENTING THE SAME TO ATMOSPHERE

Patent #:	7921696	Issue Dt:	04/12/2011	Application #:	12037111	Filing Dt:	02/26/2008
Publication #:	US20080296209	Pub Dt:	12/04/2008
Title:	LIQUID CHROMATOGRAPH DEVICE

Patent #:	7906761	Issue Dt:	03/15/2011	Application #:	12037623	Filing Dt:	02/26/2008
Publication #:	US20080230697	Pub Dt:	09/25/2008
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	7626166	Issue Dt:	12/01/2009	Application #:	12038076	Filing Dt:	02/27/2008
Publication #:	US20080203301	Pub Dt:	08/28/2008
Title:	ELECTRON MICROSCOPE

Patent #:	7663104	Issue Dt:	02/16/2010	Application #:	12038079	Filing Dt:	02/27/2008
Publication #:	US20080203297	Pub Dt:	08/28/2008
Title:	SPECIMEN INSPECTION EQUIPMENT AND HOW TO MAKE THE ELECTRON BEAM ABSORBED CURRENT IMAGES

Patent #:	7795581	Issue Dt:	09/14/2010	Application #:	12038116	Filing Dt:	02/27/2008
Publication #:	US20080210865	Pub Dt:	09/04/2008
Title:	PATTERN MEASURING METHOD AND ELECTRON MICROSCOPE

Patent #:	7745782	Issue Dt:	06/29/2010	Application #:	12038641	Filing Dt:	02/27/2008
Publication #:	US20080203298	Pub Dt:	08/28/2008
Title:	ELECTROSTATIC CHARGE MEASUREMENT METHOD, FOCUS ADJUSTMENT METHOD, AND SCANNING ELECTRON MICROSCOPE

Patent #:	8092637	Issue Dt:	01/10/2012	Application #:	12038841	Filing Dt:	02/28/2008
Publication #:	US20090218316	Pub Dt:	09/03/2009
Title:	MANUFACTURING METHOD IN PLASMA PROCESSING APPARATUS

Patent #:	8290241	Issue Dt:	10/16/2012	Application #:	12039255	Filing Dt:	02/28/2008
Publication #:	US20080226153	Pub Dt:	09/18/2008
Title:	ANALYZING APPARATUS, PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT REVIEW APPARATUS, ANALYSIS SYSTEM, AND ANALYSIS METHOD

Patent #:	7643140	Issue Dt:	01/05/2010	Application #:	12046521	Filing Dt:	03/12/2008
Publication #:	US20080239289	Pub Dt:	10/02/2008
Title:	METHOD AND APPARATUS FOR INSPECTING A SEMICONDUCTOR DEVICE

Patent #:	8040515	Issue Dt:	10/18/2011	Application #:	12051245	Filing Dt:	03/19/2008
Publication #:	US20080239311	Pub Dt:	10/02/2008
Title:	FLUORESCENCE DETECTION APPARATUS AND METHOD, AND PRISM USED THEREIN

Patent #:	7987583	Issue Dt:	08/02/2011	Application #:	12051894	Filing Dt:	03/20/2008
Publication #:	US20080231983	Pub Dt:	09/25/2008
Title:	MAGNETIC HEAD SLIDER TESTING APPARATUS AND MAGNETIC HEAD SLIDER TESTING METHOD

Patent #:	8305435	Issue Dt:	11/06/2012	Application #:	12053287	Filing Dt:	03/21/2008
Publication #:	US20090295914	Pub Dt:	12/03/2009
Title:	IMAGE PROCESSING SYSTEM AND SCANNING ELECTRON MICROSCOPE

Patent #:	8288287	Issue Dt:	10/16/2012	Application #:	12054095	Filing Dt:	03/24/2008
Publication #:	US20080176409	Pub Dt:	07/24/2008
Title:	ETCHING METHOD AND ETCHING EQUIPMENT

Patent #:	8409507	Issue Dt:	04/02/2013	Application #:	12056740	Filing Dt:	03/27/2008
Publication #:	US20080240989	Pub Dt:	10/02/2008
Title:	AUTOMATIC ANALYZER

Patent #:	7733473	Issue Dt:	06/08/2010	Application #:	12057168	Filing Dt:	03/27/2008
Publication #:	US20080239319	Pub Dt:	10/02/2008
Title:	INSPECTION APPARATUS AND INSPECTION METHOD

Patent #:	7847249	Issue Dt:	12/07/2010	Application #:	12068417	Filing Dt:	02/06/2008
Publication #:	US20080185519	Pub Dt:	08/07/2008
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	7705303	Issue Dt:	04/27/2010	Application #:	12068789	Filing Dt:	02/12/2008
Publication #:	US20080142712	Pub Dt:	06/19/2008
Title:	DEFECT INSPECTION AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	8129283	Issue Dt:	03/06/2012	Application #:	12068889	Filing Dt:	02/13/2008
Publication #:	US20080190893	Pub Dt:	08/14/2008
Title:	PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS

Patent #:	7745787	Issue Dt:	06/29/2010	Application #:	12071152	Filing Dt:	02/15/2008
Publication #:	US20080290275	Pub Dt:	11/27/2008
Title:	ELECTRON BEAM DEVICE

Patent #:	7736481	Issue Dt:	06/15/2010	Application #:	12071835	Filing Dt:	02/27/2008
Publication #:	US20080202932	Pub Dt:	08/28/2008
Title:	ELECTROPHORESIS DEVICE AND ELECTROPHORESIS METHOD

Patent #:	7599054	Issue Dt:	10/06/2009	Application #:	12073083	Filing Dt:	02/29/2008
Publication #:	US20080162065	Pub Dt:	07/03/2008
Title:	PATTERN INSPECTION APPARATUS

Patent #:	8262888	Issue Dt:	09/11/2012	Application #:	12073296	Filing Dt:	03/04/2008
Publication #:	US20080217177	Pub Dt:	09/11/2008
Title:	CAPILLARY ELECTROPHORESIS APPARATUS

Patent #:	7800059	Issue Dt:	09/21/2010	Application #:	12073359	Filing Dt:	03/04/2008
Publication #:	US20080217535	Pub Dt:	09/11/2008
Title:	METHOD OF FORMING A SAMPLE IMAGE AND CHARGED PARTICLE BEAM APPARATUS

Patent #:	7777194	Issue Dt:	08/17/2010	Application #:	12073918	Filing Dt:	03/12/2008
Publication #:	US20080224064	Pub Dt:	09/18/2008
Title:	CHARGED PARTICLE BEAM APPARATUS

Patent #:	8558999	Issue Dt:	10/15/2013	Application #:	12078097	Filing Dt:	03/27/2008
Publication #:	US20080239292	Pub Dt:	10/02/2008
Title:	Defect inspection apparatus and method utilizing multiple inspection conditions

Patent #:	7742879	Issue Dt:	06/22/2010	Application #:	12078241	Filing Dt:	03/28/2008
Publication #:	US20080237457	Pub Dt:	10/02/2008
Title:	METHOD AND APPARATUS FOR CHROMATOGRAPHY MASS SPECTROMETRY

Patent #:	7875850	Issue Dt:	01/25/2011	Application #:	12078516	Filing Dt:	04/01/2008
Publication #:	US20080251868	Pub Dt:	10/16/2008
Title:	STANDARD COMPONENT FOR CALIBRATION AND ELECTRON-BEAM SYSTEM USING THE SAME

Patent #:	7608819	Issue Dt:	10/27/2009	Application #:	12078523	Filing Dt:	04/01/2008
Publication #:	US20080185516	Pub Dt:	08/07/2008
Title:	MASS SPECTROMETER

Patent #:	8129674	Issue Dt:	03/06/2012	Application #:	12078680	Filing Dt:	04/03/2008
Publication #:	US20080315082	Pub Dt:	12/25/2008
Title:	MASS SPECTROMETRIC ANALYZER

Patent #:	7684937	Issue Dt:	03/23/2010	Application #:	12078840	Filing Dt:	04/07/2008
Publication #:	US20080215274	Pub Dt:	09/04/2008
Title:	EVALUATION METHOD OF FINE PATTERN FEATURE, ITS EQUIPMENT, AND METHOD OF SEMICONDUCTOR DEVICE FABRICATION

Patent #:	8323468	Issue Dt:	12/04/2012	Application #:	12081736	Filing Dt:	04/21/2008
Publication #:	US20080264790	Pub Dt:	10/30/2008
Title:	ION CONCENTRATION MEASURING DEVICE AND ION CONCENTRATION MEASURING ELEMENT

Patent #:	7923701	Issue Dt:	04/12/2011	Application #:	12081969	Filing Dt:	04/24/2008
Publication #:	US20090242794	Pub Dt:	10/01/2009
Title:	CHARGED PARTICLE BEAM EQUIPMENT

Patent #:	8032332	Issue Dt:	10/04/2011	Application #:	12099868	Filing Dt:	04/09/2008
Publication #:	US20080262760	Pub Dt:	10/23/2008
Title:	SEMICONDUCTOR INSPECTING APPARATUS

Patent #:	7595482	Issue Dt:	09/29/2009	Application #:	12104507	Filing Dt:	04/17/2008
Publication #:	US20080198467	Pub Dt:	08/21/2008
Title:	STANDARD COMPONENT FOR LENGTH MEASUREMENT, METHOD FOR PRODUCING THE SAME, AND ELECTRON BEAM METROLOGY SYSTEM USING THE SAME

Patent #:	8481980	Issue Dt:	07/09/2013	Application #:	12108037	Filing Dt:	04/23/2008
Publication #:	US20090230299	Pub Dt:	09/17/2009
Title:	ION SOURCE, ION BEAM PROCESSING/OBSERVATION APPARATUS, CHARGED PARTICLE BEAM APPARATUS, AND METHOD FOR OBSERVING CROSS SECTION OF SAMPLE

Patent #:	7869969	Issue Dt:	01/11/2011	Application #:	12108068	Filing Dt:	04/23/2008
Publication #:	US20080270044	Pub Dt:	10/30/2008
Title:	DEFECT REVIEW APPARATUS AND METHOD OF REVIEWING DEFECTS

Patent #:	8274652	Issue Dt:	09/25/2012	Application #:	12109363	Filing Dt:	04/25/2008
Publication #:	US20080297783	Pub Dt:	12/04/2008
Title:	DEFECT INSPECTION SYSTEM AND METHOD OF THE SAME

Patent #:	7935927	Issue Dt:	05/03/2011	Application #:	12110443	Filing Dt:	04/28/2008
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Title:	METHOD AND APPARATUS FOR OBSERVING A SPECIMEN

Patent #:	7817261	Issue Dt:	10/19/2010	Application #:	12114139	Filing Dt:	05/02/2008
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Title:	METHOD OF APPARATUS FOR DETECTING PARTICLES ON A SPECIMEN

Patent #:	8035071	Issue Dt:	10/11/2011	Application #:	12116241	Filing Dt:	05/07/2008
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Title:	CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT

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Title:	PROBE NAVIGATION METHOD AND DEVICE AND DEFECT INSPECTION DEVICE

Patent #:	7705304	Issue Dt:	04/27/2010	Application #:	12120053	Filing Dt:	05/13/2008
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Title:	SCANNING ELECTRON MICROSCOPE AND THREE-DIMENSIONAL SHAPE MEASURING DEVICE THAT USED IT

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Title:	REACTION CUVETTE FOR AUTOMATIC ANALYZER AND METHOD OF SURFACE TREATMENT FOR REACTION CUVETTE

100

Patent #:	9097691	Issue Dt:	08/04/2015	Application #:	12121006	Filing Dt:	05/15/2008
Publication #:	US20080286162	Pub Dt:	11/20/2008
Title:	SAMPLE HANDLING SYSTEM

Assignor

HITACHI HIGH-TECHNOLOGIES CORPORATION

Exec Dt:

02/12/2020

Assignee

HITACHI HIGH-TECH CORPORATION

17-1, TORANOMON 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondence name and address
	MATTINGLY & MALUR PC
	1800 DIAGONAL ROAD
	SUITE 210
	ALEXANDRIA, VA 22314

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