Patent Assignment Details
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| Reel/Frame: | 058193/0560 | |
| Pages: | 5 |
| | Recorded: | 11/23/2021 | | |
| Attorney Dkt #: | 4448-0603PUS2 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/09/2024
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Application #:
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17532767
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Filing Dt:
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11/22/2021
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Publication #:
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Pub Dt:
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04/21/2022
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Title:
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X-RAY REFLECTOMETRY APPARATUS AND METHOD THEREOF FOR MEASURING THREE DIMENSIONAL NANOSTRUCTURES ON FLAT SUBSTRATE
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Assignee
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| 195, SEC. 4, CHUNG HSING RD., CHUTUNG |
| HSINCHU, TAIWAN 310401 |
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Correspondence name and address
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BIRCH STEWART KOLASCH & BIRCH LLP
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8110 GATEHOUSE RD.
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SUITE 100E
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FALLS CHURCH, VA 22042-1248
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05/11/2024 05:54 PM
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