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Reel/Frame:058573/0535   Pages: 7
Recorded: 12/23/2021
Attorney Dkt #:01213GEN
Conveyance: CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Total properties: 20
1
Patent #:
Issue Dt:
06/27/2006
Application #:
10765147
Filing Dt:
01/28/2004
Publication #:
Pub Dt:
09/23/2004
Title:
SUBSTRATE PROCESSING APPARATUS
2
Patent #:
Issue Dt:
05/01/2007
Application #:
11019111
Filing Dt:
12/22/2004
Publication #:
Pub Dt:
09/15/2005
Title:
ELECTRON BEAM APPARATUS WITH DETAILED OBSERVATION FUNCTION AND SAMPLE INSPECTING AND OBSERVING METHOD USING ELECTRON BEAM APPARATUS
3
Patent #:
Issue Dt:
08/29/2006
Application #:
11134330
Filing Dt:
05/23/2005
Publication #:
Pub Dt:
09/22/2005
Title:
ELECTRON BEAM APPARATUS AND DEVICE MANUFACTURING METHOD USING SAME
4
Patent #:
Issue Dt:
04/01/2008
Application #:
11723591
Filing Dt:
03/21/2007
Publication #:
Pub Dt:
08/30/2007
Title:
ELECTRON BEAM APPARATUS WITH DETAILED OBSERVATION FUNCTION AND SAMPLE INSPECTING AND OBSERVING METHOD USING ELECTRON BEAM APPARATUS
5
Patent #:
Issue Dt:
04/15/2014
Application #:
11730891
Filing Dt:
04/04/2007
Publication #:
Pub Dt:
10/11/2007
Title:
Polishing apparatus and polishing method
6
Patent #:
Issue Dt:
01/04/2011
Application #:
11760235
Filing Dt:
06/08/2007
Publication #:
Pub Dt:
03/20/2008
Title:
ELECTRON BEAM APPARATUS AND AN ABERRATION CORRECTION OPTICAL APPARATUS
7
Patent #:
Issue Dt:
08/03/2010
Application #:
11882398
Filing Dt:
08/01/2007
Publication #:
Pub Dt:
12/13/2007
Title:
SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
8
Patent #:
Issue Dt:
05/31/2011
Application #:
12162071
Filing Dt:
07/24/2008
Publication #:
Pub Dt:
01/29/2009
Title:
APPARATUS AND METHOD FOR INSPECTING SAMPLE SURFACE
9
Patent #:
Issue Dt:
02/08/2011
Application #:
12184032
Filing Dt:
07/31/2008
Publication #:
Pub Dt:
12/25/2008
Title:
SUBSTRATE HOLDING MECHANISM, SUBSTRATE POLISHING APPARATUS AND SUBSTRATE POLISHING METHOD
10
Patent #:
Issue Dt:
12/13/2011
Application #:
12289507
Filing Dt:
10/29/2008
Publication #:
Pub Dt:
04/30/2009
Title:
POLISHING APPARATUS AND POLISHING METHOD
11
Patent #:
Issue Dt:
10/08/2013
Application #:
12311560
Filing Dt:
04/03/2009
Publication #:
Pub Dt:
01/21/2010
Title:
Processing end point detection method, polishing method,and polishing apparatus
12
Patent #:
Issue Dt:
09/25/2012
Application #:
12537414
Filing Dt:
08/07/2009
Publication #:
Pub Dt:
02/11/2010
Title:
SUBSTRATE SURFACE INSPECTION METHOD AND INSPECTION APPARATUS
13
Patent #:
Issue Dt:
10/23/2012
Application #:
12618033
Filing Dt:
11/13/2009
Publication #:
Pub Dt:
03/11/2010
Title:
SUBSTRATE HOLDING MECHANISM, SUBSTRATE POLISHING APPARATUS AND SUBSTRATE POLISHING METHOD
14
Patent #:
Issue Dt:
08/13/2013
Application #:
12667891
Filing Dt:
01/06/2010
Publication #:
Pub Dt:
01/06/2011
Title:
POLISHING APPARATUS AND POLISHING METHOD
15
Patent #:
Issue Dt:
03/05/2013
Application #:
12700917
Filing Dt:
02/05/2010
Publication #:
Pub Dt:
06/17/2010
Title:
SUBSTRATE POLISHING APPARATUS
16
Patent #:
Issue Dt:
10/29/2013
Application #:
12897973
Filing Dt:
10/05/2010
Publication #:
Pub Dt:
04/07/2011
Title:
POLISHING ENDPOINT DETECTION APPARATUS
17
Patent #:
Issue Dt:
05/21/2013
Application #:
13027551
Filing Dt:
02/15/2011
Publication #:
Pub Dt:
08/25/2011
Title:
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
18
Patent #:
Issue Dt:
02/04/2014
Application #:
13036114
Filing Dt:
02/28/2011
Publication #:
Pub Dt:
09/08/2011
Title:
POLISHING APPARATUS AND POLISHING METHOD
19
Patent #:
Issue Dt:
02/19/2019
Application #:
14017620
Filing Dt:
09/04/2013
Publication #:
Pub Dt:
01/02/2014
Title:
PROCESSING END POINT DETECTION METHOD, POLISHING METHOD, AND POLISHING APPARATUS
20
Patent #:
Issue Dt:
07/15/2014
Application #:
14036321
Filing Dt:
09/25/2013
Publication #:
Pub Dt:
01/23/2014
Title:
POLISHING ENDPOINT DETECTION METHOD
Assignor
1
Exec Dt:
08/01/2018
Assignee
1
1-1, SHIBAURA 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondence name and address
WENDEROTH, LIND & PONACK, L.L.P.
1025 CONNECTICUT AVENUE NW
SUITE 500
WASHINGTON, DC 20036

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