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Reel/Frame:059680/0197   Pages: 19
Recorded: 04/22/2022
Attorney Dkt #:211256US01
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
17726992
Filing Dt:
04/22/2022
Publication #:
Pub Dt:
10/26/2023
Title:
Method For Improving Etch Rate And Critical Dimension Uniformity When Etching High Aspect Ratio Features Within A Hard Mask Layer
Assignors
1
Exec Dt:
03/30/2022
2
Exec Dt:
03/30/2022
3
Exec Dt:
04/14/2022
4
Exec Dt:
03/31/2022
5
Exec Dt:
04/20/2022
6
Exec Dt:
04/11/2022
Assignee
1
3-1 AKASAKA 5-CHOME, MINATO-KU
TOKYO, JAPAN 107-6325
Correspondence name and address
TEL-EGAN, ENDERS & HUSTON LLP.
1101 S CAPITAL OF TEXAS HWY
BLDG. C, SUITE 200
AUSTIN, TX 78746

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